K. Beyer
发表
J. Warnock,
S. Furkay,
D. Moy,
1993,
Symposium 1993 on VLSI Technology.
S. Greco,
J. Sun,
W. Abadeer,
1996,
Proceedings of 1st International Symposium on Plasma Process-Induced Damage.
S. Greco,
M. Hargrove,
X. Chen,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).