K. Beyer

发表

J. Warnock, S. Furkay, D. Moy, 1993, Symposium 1993 on VLSI Technology.

S. Greco, J. Sun, W. Abadeer, 1996, Proceedings of 1st International Symposium on Plasma Process-Induced Damage.

S. Greco, M. Hargrove, X. Chen, 1999, 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).