D. Shin

High performance 5nm radius Twin Silicon Nanowire MOSFET (TSNWFET) : fabrication on bulk si wafer, characteristics, and reliability

B. Ryu, Sung Hwan Kim, Donggun Park, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Effects of Morphological Changes of Pt/SrBi2Ta2O9 Interface on the Electrical Properties of Ferroelectric Capacitor.

I. Choi, D. Shin, Ho Nyung Lee, 1998 .

Negative bias temperature instability of carrier-transport enhanced pMOSFET with performance boosters

N. Lee, D. Shin, H. Rhee, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..

Record Effective Mobility Obtained From In0.53Ga0.47As/In0.52Al0.48As Quantum-Well MOSFETs on 300-mm Si Substrate

Seung Ryul Lee, Daehyun Kim, J. Park, 2017, IEEE Electron Device Letters.

MEMORY WINDOW OF PT/SRBI2TA2O9/CEO2/SIO2/SI STRUCTURE FOR METAL FERROELECTRIC INSULATOR SEMICONDUCTOR FIELD EFFECT TRANSISTOR

D. Shin, Y. Kim, 1997 .

SrBi2Ta2O9 thin films grown by MOCVD using a novel double metal alkoxide precursor

H. Choi, I. Choi, D. Shin, 2000 .

Characteristics of Pt/SrTiO3/Pb(Zr0.52, Ti0.48)O3/SrTiO3/Si ferroelectric gate oxide structure

Dong Suk Shin, Sang Tae Park, H. Choi, 1999 .

Electrical Properties of Pt/SrBi2Ta2O9/CeO2/SiO2/Si Structure for Nondestructive Readout Memory

I. Choi, D. Shin, Ho Nyung Lee, 1998 .

Effects of Bi-Pt alloy on electrical characteristics of Pt/SrBi2Ta2O9/CeO2/Si ferroelectric gate structure

Young K. Park, I. Choi, D. Shin, 1999 .