R. Gauthier
发表
Junjun Li,
K. Chatty,
R. Gauthier,
2009,
2009 31st EOS/ESD Symposium.
H. Gossner,
R. Gauthier,
R. Gaertner,
2013
.
M. Hargrove,
S. Voldman,
R. Gauthier,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
Steven H. Voldman,
Robert J. Gauthier,
S. Voldman,
1998,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
H. Gossner,
T. Pompl,
K. Chatty,
2007
.
Junjun Li,
K. Chatty,
R. Gauthier,
2009,
2009 31st EOS/ESD Symposium.
Robert Gauthier,
James Di Sarro,
Junjun Li,
2013,
2013 35th Electrical Overstress/Electrostatic Discharge Symposium.
R. Gauthier,
Rahul Mishra,
Junjun Li,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
R. Gauthier,
K. Chatty,
E. Rosenbaum,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
R. Gauthier,
K. Chatty,
S. Mitra,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Junjun Li,
K. Chatty,
R. Gauthier,
2011,
IEEE Transactions on Device and Materials Reliability.
Souvick Mitra,
Yang Yang,
Dimitris E. Ioannou,
2010,
2010 IEEE International Reliability Physics Symposium.
Souvick Mitra,
Robert Gauthier,
Elyse Rosenbaum,
2009,
2009 31st EOS/ESD Symposium.
M. Muhammad,
R. Gauthier,
K. Chatty,
2003,
2003 IEEE International Conference on SOI.
C. Putnam,
E. Rosenbaum,
R. Gauthier,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
You Li,
Junjun Li,
R. Gauthier,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
C. Putnam,
R. Gauthier,
S. Mitra,
2009,
2009 31st EOS/ESD Symposium.
Thomas Pompl,
Wolfgang Stadler,
Kai Esmark,
2007,
2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
J. Zeng,
S. Samavedam,
B. Senapati,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
Junjun Li,
Davood Shahrjerdi,
Robert Gauthier,
2010,
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Robert Gauthier,
Bill Reynolds,
James P. Di Sarro,
2014,
IEEE Transactions on Device and Materials Reliability.
Franco Stellari,
Alan J. Weger,
Peilin Song,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
R. Gauthier,
C. Seguin,
S. Mitra,
2008,
EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
K. Chatty,
C. Seguin,
R. Halbach,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
R. Gauthier,
J. Pekarik,
J. Pekarik,
1998,
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347).
R. Gauthier,
K. Chatty,
C. Seguin,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.