Jiachun Zheng

Dynamic NBTI of PMOS transistors and its impact on device lifetime

D. Kwong, Ming-Fu Li, M. Li, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Energy gap and band alignment for (HfO2)x(Al2O3)1−x on (100) Si

Dim-Lee Kwong, Byung Jin Cho, Chew Hoe Ang, 2002 .

Hardening silicon-on-insulator nMOSFETs by multiple-step Si+ implantation

Yanyan Huang, Kai Tang, Jiachun Zheng, 2016, Microelectron. Reliab..

Dynamic NBTI of p-MOS transistors and its impact on MOSFET scaling

D. Kwong, M. Li, G. Chen, 2002, IEEE Electron Device Letters.