A. Krstic

Experience in critical path selection for deep sub-micron delay test and timing validation

L. Wang, J. Liou, A. Krstic, 2003, Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003..

Vector Generation For Maximum Instantaneous Current Through Supply Lines For CMOS Circuits

K. Cheng, A. Krstic, 1997, Proceedings of the 34th Design Automation Conference.

- 1-Test Automation-Automatic Test Generation Technology and Its Applications

Kwang-Ting, A. Krstic, 1999 .

False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation

Jing-Jia Liou, Kwang-Ting Cheng, A. Krstic, 2002, Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324).

Fast statistical timing analysis by probabilistic event propagation

Kwang-Ting Cheng, Jing-Jia Liou, S. Kundu, 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).

Statistical Timing Analysis By Propagation

Kwang-Ting Cheng, Angela Krstic, Jing-Jia Liou, 2001 .

Delay testing considering crosstalk-induced effects

Kwang-Ting Cheng, Angela Krstic, Jing-Jia Liou, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Delay fault testing for VLSI circuits

Kwang-Ting Cheng, Angela Krstic, K. Cheng, 1998 .