Xing Zhang

发表

Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process

Song Jia, Xing Zhang, Yuan Wang, 2016, Science China Information Sciences.

Design of a novel static-triggered power-rail ESD clamp circuit in a 65-nm CMOS process

Xing Zhang, Yuan Wang, Jian Cao, 2016, Science China Information Sciences.

A novel diode string triggered gated-PiN junction device for electrostatic discharge protection in 65-nm CMOS technology

Guangyi Lu, Xing Zhang, Lizhong Zhang, 2015 .

A 4.9–6.9 GHz LC VCO with low-phase-noise

Jian Cao, S. Jia, Xing Zhang, 2013, 2013 IEEE International Conference of Electron Devices and Solid-state Circuits.

Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology

Xing Zhang, Yuan Wang, Wei Su, 2015, IEICE Trans. Electron..

A 1‐Gbps reference‐less burst‐mode CDR with embedded TDC in a 65‐nm CMOS process

Song Jia, Xing Zhang, Yuan Wang, 2018, Int. J. Circuit Theory Appl..

A 65-nm 1-Gb NOR floating-gate flash memory with less than 50-ns access time

Yun Yang, Ming Liu, Jing Liu, 2014 .

Compact digital-controlled neuromorphic circuit with low power consumption

Jin Zhang, Xing Zhang, Yuan Wang, 2017, 2017 IEEE International Symposium on Circuits and Systems (ISCAS).

Theory and verification of operator design methodology

Ru Huang, Xing Zhang, Xin'an Wang, 2012, Science China Information Sciences.

Study of LDMOS-SCR: A high voltage ESD protection device

Song Jia, Xing Zhang, Yuan Wang, 2010, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.

Comprehensive study and corresponding improvements on the ESD robustness of different nLDMOS devices

Song Jia, Xing Zhang, Yuan Wang, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

A Reconfigurable Mixed Signal CMOS Design for Multiple STDP Learning Rules

Xing Zhang, Yuan Wang, Xiaoxin Cui, 2020, 2020 IEEE 3rd International Conference on Electronics Technology (ICET).

Challenges of 22 nm and beyond CMOS technology

Yu Tian, Xing Zhang, Liangliang Zhang, 2009, Science in China Series F: Information Sciences.