K. Tsuchida

发表

Akihito Yamamoto, Dongkeun Kim, Jinwon Park, 2017, 2017 IEEE International Solid-State Circuits Conference (ISSCC).

Y. Akasaka, Y. Toyoshima, K. Nakajima, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Yukihito Oowaki, Daisaburo Takashima, Kenji Tsuchida, 1990 .

Yukihito Oowaki, Daisaburo Takashima, Shigeyoshi Watanabe, 1991, 1991 Symposium on VLSI Circuits.

Yukihito Oowaki, Kenji Tsuchida, Y. Oowaki, 1989 .

Yukihito Oowaki, Daisaburo Takashima, Shigeyoshi Watanabe, 1992 .

M. Wada, S. Shiratake, T. Inaba, 1999, 1999 Symposium on VLSI Circuits. Digest of Papers (IEEE Cat. No.99CH36326).

H. Kanaya, H. Oyamatsu, S.-W. Chung, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Akihiro Nitayama, Hiroaki Yoda, Tatsuya Kishi, 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.

Yoshihiro Ueda, Hiroaki Yoda, Yohji Watanabe, 2010, 2010 IEEE International Solid-State Circuits Conference - (ISSCC).

K. Tsuchida, Y. Ogwaki, M. Ohta, 1989, Symposium 1989 on VLSI Circuits.