P. Candelier
发表
T. Skotnicki,
C. Fenouillet-Béranger,
R. Ranica,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
C. Cagli,
C. Carabasse,
J. Nodin,
2013
.
G. Molas,
E. Vianello,
J. Nodin,
2013,
2013 5th IEEE International Memory Workshop.
E. Vianello,
J. Nodin,
H. Grampeix,
2014,
2014 IEEE International Reliability Physics Symposium.
P. Candelier,
M. Jourdain,
F. Nebel,
1997
.
Didier Goguenheim,
Dominique Vuillaume,
Alain Bravaix,
1997
.
T. Skotnicki,
A. Villaret,
P. Candelier,
2007,
ESSDERC 2007 - 37th European Solid State Device Research Conference.
R. Ranica,
A. Villaret,
P. Candelier,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005..
P. Candelier,
P. Waltz,
S. Renard,
2005,
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..
B. De Salvo,
G. Ghibaudo,
G. Reimbold,
1999,
IEEE Electron Device Letters.
B. De Salvo,
G. Ghibaudo,
G. Reimbold,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).
P. Candelier,
G. Dauphin,
M. Gendraud,
1989
.
S. Jeannot,
V. Jousseaume,
M. Gros-Jean,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
C. Muller,
S. Jeannot,
E. Vianello,
2014,
2014 IEEE 6th International Memory Workshop (IMW).
S. Jeannot,
V. Jousseaume,
L. Perniola,
2013,
2013 IEEE International Integrated Reliability Workshop Final Report.
S. Jeannot,
E. Vianello,
L. Perniola,
2016,
2016 IEEE 8th International Memory Workshop (IMW).
Assia Tria,
Vincent Beroulle,
David Hély,
2014,
2014 17th Euromicro Conference on Digital System Design.
Didier Goguenheim,
Dominique Vuillaume,
Alain Bravaix,
1999
.
Claire Fenouillet-Beranger,
Stephane Denorme,
Elisa Vianello,
2016
.
Bruno Allard,
Philippe Candelier,
Elodie Ebrard,
2009,
Microelectronics Journal.
G. Reimbold,
F. Martin,
B. Guillaumot,
1997,
IEEE Electron Device Letters.