I. Pugacz‐Muraszkiewicz

Detection of discontinuities in passivating layers on silicon by NaOH anisotropic etch

I. Pugacz‐Muraszkiewicz, 1972 .

Application of silicates to the detection of flaws in glassy passivation films deposited on silicon substrates

I. Pugacz‐Muraszkiewicz, B. Hammond, 1977 .

Local Stress Measurement in Thin Thermal SiO2 Films on Si Substrates

I. Pugacz‐Muraszkiewicz, S. C. Lin, 1972 .