C. Drum

发表

A Low‐Stress Insulating Film on Silicon by Chemical Vapor Deposition

C. Drum, M. Rand, 1968 .

Electron Microscopy of Dislocations and Other Defects in Sapphire and in Silicon Carbide, Thinned by Sputtering

C. Drum, 1965, May 1.

Stacking faults in (100) epitaxial silicon caused by HF and thermal oxidation and effects on p‐n junctions

W. V. Gelder, C. Drum, 1972 .

EXTRINSIC STACKING FAULTS IN SILICON AFTER HEATING IN WET OXYGEN

R. Jaccodine, C. Drum, 1966 .

Axial Imperfections in Filamentary Crystals of Aluminum Nitride. I

C. Drum, 1965 .

Twist and Axial Imperfections in Filamentary Crystals of Aluminum Nitride. II

C. Drum, 1965 .

ELECTRON MICROSCOPIC EXAMINATION OF ROLE OF AXIAL DISLOCATIONS IN GROWTH OF AlN WHISKERS

J. Mitchell, C. Drum, 1964 .

Intersecting faults on basal and prismatic planes in aluminium nitride

C. Drum, C. M. Drum, 1965 .

Ion‐implantation‐damage gettering effect in silicon photodiode array camera target

C. Drum, C. Hsieh, K. Pickar, 1973 .

Diffraction contrast effects from stacking faults with phase angle π

C. Drum, M. Whelan, 1965 .

Measurements of spontaneous bending attributed to surface stresses in thin crystals in aluminium nitride

C. Drum, 1966 .

Geometrical Stability of Shallow Surface Depressions During Growth of (111) and (100) Epitaxial Silicon

C. Drum, C. A. Clark, 1968 .

Twyman‐Green Interferometry for Measurements of Stresses in Thin Films on Optically Flat Silicon Substrates

C. Drum, 1969 .