A. V. Ferris-Prabhu

发表

Effect of design considerations on productivity at wafer level

A. V. Ferris-Prabhu, 1994 .

Modeling the critical area in yield forecasts

A. V. Ferris-Prabhu, A. Ferris-Prabhu, 1985 .

Parameters for optimization of device productivity at wafer level

A. V. Ferris-Prabhu, A. Ferris-Prabhu, 1992 .

A cluster-modified Poisson model for estimating defect density and yield

A. V. Ferris-Prabhu, 1990 .

Defect size variations and their effect on the critical area of VLSI devices

A. V. Ferris-Prabhu, A. Ferris-Prabhu, 1985 .

Vlsi yield management and prediction

A. V. Ferris-Prabhu, 1985 .

Theory of MNOS memory device behavior

A. V. Ferris-Prabhu, 1973 .

The Effect on Yield of Clustering and Radial Variations in Defect Density

A. V. Ferris-Prabhu, M. A. Retersdorf, 1990 .

Maximum tunnelling distance in MNOS devices theory

A. V. Ferris-Prabhu, 1972 .

Defects, Faults and Semiconductor Device Yield

A. V. Ferris-Prabhu, A. Ferris-Prabhu, 1989 .

Charge transfer in layered insulators

A. V. Ferris-Prabhu, A. Ferris-Prabhu, 1973 .