I. Ogoh

Improved address buffers, TTL input current reduction, and hidden refresh test mode in a 4-Mb DRAM

Michihiro Yamada, Shigeru Mori, Hiroshi Miyamoto, 1990 .

Ion Induced Auger Electron Emission from Al-Mg Alloy under Low Energy Argon Ion Bombardment

I. Ogoh, R. Shimizu, Y. Yamauchi, 1985 .

Secondary Electron Measurement with Auger Electron Microprobe. I. Calibration of the CMA in the Low-Energy Region

I. Ogoh, R. Shimizu, H. Hashimoto, 1985 .