Jun Seomun

Frequency and yield optimization using power gates in power-constrained designs

Nam Sung Kim, Ken Choi, Abhishek A. Sinkar, 2009, ISLPED.

Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics

Bernd Becker, Matthias Sauer, Subhasish Mitra, 2013, Proceedings of the IEEE 2013 Custom Integrated Circuits Conference.

Early-life-failure detection using SAT-based ATPG

Bernd Becker, Matthias Sauer, Subhasish Mitra, 2013, 2013 IEEE International Test Conference (ITC).