Je‐hun Lee

发表

Electrical observations of filamentary conductions for the resistive memory switching in NiO films

S. O. Park, I. Baek, S. Seo, 2006 .

Metal Oxide Thin Film Phototransistor for Remote Touch Interactive Displays

U. Chung, Changjung Kim, S. Ahn, 2012, Advanced materials.

Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress

U. Chung, Changjung Kim, J. Robertson, 2010 .

42.2: World's Largest (15‐inch) XGA AMLCD Panel Using IGZO Oxide TFT

Jang-Yeon Kwon, Shi Yul Kim, Dong Ju Yang, 2008 .

An investigation of contact resistance between metal electrodes and amorphous gallium–indium–zinc oxide (a-GIZO) thin-film transistors

Jong-Wan Park, Je-Hun Lee, Je‐hun Lee, 2010 .

P‐203L: Late‐News Poster: Analytical I‐V and C‐V Models for Amorphous InGaZnO TFTs and Their Application to Circuit Simulations

Changjung Kim, Y. Jeon, Je‐hun Lee, 2011 .

Subgap Density-of-States-Based Amorphous Oxide Thin Film Transistor Simulator (DeAOTS)

U-In Chung, Dong Myong Kim, Dae Hwan Kim, 2010, IEEE Transactions on Electron Devices.

P‐205L: Late‐News Poster: Comparison between a‐InGaZnO and a‐InHfZnO TFTs in Perspective of Subgap Density of States (DOS) in Active Film

Y. Jeon, Je‐hun Lee, Sangwon Lee, 2010 .

10.3: Invited Paper: High Mobility Oxide TFTs for Future LCD Applications

Je-Hun Lee, Byung Du Ahn, Jun Hyung Lim, 2013 .

P‐202L: Late‐News Poster: Density‐of‐States Based Analysis on the Effect of Active Thin‐film Thickness on Current Stress‐induced Instability in Amorphous InGaZnO AMOLED Driver TFTs

Y. Jeon, Je‐hun Lee, D. M. Kim, 2011 .

Relation Between Low-Frequency Noise and Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Y. Jeon, Je‐hun Lee, Jae-Woo Park, 2010, IEEE Electron Device Letters.

The influence of hafnium doping on bias stability in zinc oxide thin film transistors

Je‐hun Lee, Jong-Wan Park, B. Ahn, 2011 .

Improvement in the negative bias temperature stability of ZnO based thin film transistors by Hf and Sn doping

Je‐hun Lee, Jong-Wan Park, B. Ahn, 2011 .

The Influence of the Hafnium Doping on Negative Bias Stability in Zinc Oxide Thin Film Transistor

Je‐hun Lee, Jong-Wan Park, B. Ahn, 2010 .

Physical and electrical properties of ultrathin HfO2/HfSixOy stacked gate dielectrics on compressively strained-Si0.74Ge0.26/Si heterolayers

S. Maikap, Doh-Yeon Kim, Je‐hun Lee, 2004 .

Effect of film thickness and annealing temperature on hillock distributions in pure Al films

Young‐Chang Joo, Je‐hun Lee, C. Jeong, 2007 .

Charge storage and photoluminescence characteristics of silicon oxide embedded Ge nanocrystal trilayer structures

S. Maikap, G. Kar, Je‐hun Lee, 2004 .

Effect of the Liquid‐Phase Characteristic on the Microstructures and Dielectric Properties of Donor‐ (Niobium) and Acceptor‐ (Magnesium) Doped Barium Titanate

Doh-Yeon Kim, Je‐hun Lee, N. Hwang, 2003 .

25.2: Photo‐Sensor Thin Film Transistor based on Double Metal‐Oxide Layer for In‐cell Remote Touch Screen

U. Chung, Changjung Kim, S. Ahn, 2012 .

Ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructure

S. Maikap, Je‐hun Lee, S. Ray, 2004 .

Intergranular glassy phase free SiC ceramics retains strength at 1500 °C

T. Nishimura, Doh-Yeon Kim, Je‐hun Lee, 2004 .

Effect of the Liquid-Forming Additive Content on the Kinetics of Abnormal Grain Growth in Alumina

Seong‐Hyeon Hong, Doh-Yeon Kim, Je‐hun Lee, 2003 .

Grain boundary crystallization during furnace cooling of α-SiC sintered with Y2O3–Al2O3–CaO

Doh-Yeon Kim, Je‐hun Lee, Young‐Wook Kim, 2006 .

Core-Shell Structure of Acceptor-Rich, Coarse Barium Titanate Grains

Doh-Yeon Kim, Je‐hun Lee, N. Hwang, 2004 .

Coarsening Process of Penetration‐Twinned Grains in PMN‐35 mol% PT Ceramics

W. Jo, Doh-Yeon Kim, Je‐hun Lee, 2004 .

Dielectric characteristics of Al2O3–HfO2 nanolaminates on Si(100)

Kwangho Jeong, Chung-Nam Whang, Hyejin Choi, 2002 .

Persistent photoconductivity in Hf–In–Zn–O thin film transistors

U-In Chung, Arokia Nathan, John Robertson, 2010 .

Thermal stability and structural characteristics of HfO2 films on Si (100) grown by atomic-layer deposition

Je-Hun Lee, Kwangho Jeong, Chung-Nam Whang, 2002 .

Field-emission characteristics from wide-bandgap material-coated carbon nanotubes

J. M. Kim, S. Yu, W. Kim, 2002 .

Anisotropy of grain boundary energies as cause of abnormal grain growth in electroplated copper films

Young‐Chang Joo, Jong-Min Paik, Je‐hun Lee, 2003 .

P‐16: Light‐Bias Induced Instability and Persistent Photoconductivity in In‐Zn‐O/Ga‐In‐Zn‐O Thin Film Transistors

U-In Chung, Arokia Nathan, John Robertson, 2011 .

Improvement of resistive memory switching in NiO using IrO2

U-In Chung, In-Gyu Baek, Hae-Sung Kim, 2006 .

Investigation on the negative bias illumination stress-induced instability of amorphous indium-tin-zinc-oxide thin film transistors

Je‐hun Lee, Sung-Jin Choi, D. M. Kim, 2014 .

Effects of interfacial NH3/N2O-plasma treatment on the structural and electrical properties of ultra-thin HfO2 gate dielectrics on p-Si substrates

Je-Hun Lee, Won Kook Choi, Rajat Mahapatra, 2005 .

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

U-In Chung, Young-soo Park, Eunha Lee, 2009 .

Cation composition effects on electronic structures of In-Sn-Zn-O amorphous semiconductors

Hanchul Kim, Je‐hun Lee, D. Kim, 2013 .

Characteristics of ultrathin HfO2 gate dielectrics on strained-Si0.74Ge0.26 layers

S. Maikap, Doh-Yeon Kim, Je‐hun Lee, 2003 .

Effects of Metal Electrode on the Electrical Performance of Amorphous In–Ga–Zn–O Thin Film Transistor

Young‐Chang Joo, Je‐hun Lee, J. Kwon, 2011 .

Effects of Oxygen Partial Pressure on the Electrical Characteristics of InGaZnO Thin Film Transistors

Je‐hun Lee, Jong-Wan Park, C. Jeong, 2009 .

Amorphous Indium Gallium Zinc Oxide Semiconductor Thin Film Transistors Using O2 Plasma Treatment on the SiNx Gate Insulator

Je‐hun Lee, Jong-Wan Park, B. Ahn, 2010 .

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

Y. Jeon, Je‐hun Lee, H. Kwon, 2012, IEEE Electron Device Letters.

In situ study of stress relaxation mechanisms of pure Al thin films during isothermal annealing

Young‐Chang Joo, Je‐hun Lee, Young-Bae Park, 2006 .

Characteristics of ZnO-based TFT Using La2O3 High-k Dielectrics

Je‐hun Lee, Jong-Wan Park, C. Jeong, 2009 .

Structural and electrical characteristics of the interfacial layer of ultrathin ZrO2 films on partially strain compensated Si0.69Ge0.3C0.01 layers

S. Maikap, G. Kar, Doh-Yeon Kim, 2003 .

Evolutions of Surface Morphologies in Sputtered and Electroplated Cu Films During Thermal Cycling

K. Oh, Young‐Chang Joo, Je‐hun Lee, 2002 .