S. Winters

Dynamic recovery of negative bias temperature instability in p-type metal–oxide–semiconductor field-effect transistors

J. Babcock, M. Ershov, S. Saxena, 2003 .

Transient effects and characterization methodology of negative bias temperature instability in pMOS transistors

J. Babcock, M. Ershov, S. Saxena, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..

Characterization and modeling of MOSFET mismatch of a deep submicron technology

S. Minehane, Christopher Hess, H. Karbasi, 2003, International Conference on Microelectronic Test Structures, 2003..

Degradation dynamics, recovery, and characterization of negative bias temperature instability

S. Minehane, H. Karbasi, M. Ershov, 2005, Microelectron. Reliab..