R. Kontra
发表
T. Sullivan,
F. Chen,
O. Bravo,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
R. Kontra,
A. Otto,
J. B. Sande,
1992
.
R. Kontra,
J. B. Sande,
D. Rudman,
1988
.
An electron microscopy study of superconducting YbBa2Cu3Ox produced by oxidizing metallic precursors
R. Kontra,
J. B. Sande,
T. Kogure,
1988
.
J. Gill,
M. Shinosky,
T. Ema,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
T. Hook,
R. Kontra,
J. Burnham,
2003,
2003 8th International Symposium Plasma- and Process-Induced Damage..
R. Kontra,
J. B. Sande,
T. Kogure,
1988
.
R. Kontra,
A. Otto,
J. B. Sande,
1996
.
Z. Wang,
R. Kontra,
A. Goyal,
1993
.
R. Kontra,
R. K. Williams,
Z. L. Wang,
1994
.
T. Standaert,
J. Gambino,
P. Biolsi,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Fen Chen,
M. Shinosky,
Yanfeng Wang,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
P. Andry,
R. Kontra,
E. Adams,
1995
.