C. Williams

发表

Two-step dopant diffusion study performed in two dimensions by scanning capacitance microscopy and TSUPREM IV

J. Kim, J. McMurray, C. Williams, 1998 .

Surface and tip characterization for quantitative two dimensional dopant profiling by scanning capacitance microscopy

J. McMurray, C. Williams, V. Zavyalov, 1998 .

Advances in experimental technique for quantitative two-dimensional dopant profiling by scanning capacitance microscopy

J. McMurray, C. Williams, V. Zavyalov, 1999 .

Optical ranging by wavelength multiplexed interferometry

H. K. Wickramasinghe, C. Williams, 1986 .

Scanning thermal profiler

H. K. Wickramasinghe, C. Williams, 1986 .

Scanning chemical potential microscope: A new technique for atomic scale surface investigation

H. K. Wickramasinghe, C. Williams, 1991 .

Lateral dopant profiling in semiconductors by force microscopy using capacitive detection

H. K. Wickramasinghe, D. Abraham, C. Williams, 1991 .

TWO-DIMENSIONAL DOPANT PROFILING BY SCANNING CAPACITANCE MICROSCOPY

Clayton C. Williams, C. Williams, 1999 .

Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy

C. Williams, J. Slinkman, Y. Huang, 1995 .

Shear force microscopy with capacitance detection for near‐field scanning optical microscopy

C. Williams, J.-K. Leong, 1995 .

Scanning thermal profiler

H. K. Wickramasinghe, C. Williams, 1986 .

High Resolution Thermal Microscopy

H. K. Wickramasinghe, C. Williams, 1986, IEEE 1986 Ultrasonics Symposium.

Atomic ordering of GaInP studied by Kelvin probe force microscopy

G. B. Stringfellow, C. Williams, Y. Leng, 1995 .

Local density of trap states in SiO2 and Si3N4 films studied by single electron tunneling force spectroscopy

C. Williams, D. Winslow, 2011 .

Nanometer scale study of HfO2 trap states using single electron tunneling force spectroscopy

C. Williams, D. Winslow, J. Johnson, 2011 .

Single-electron tunneling to insulator surfaces detected by electrostatic force

C. Williams, Levente Klein, 2002 .

Instability induced tunneling and repeatable charge injection to SiO2 surfaces by electrostatic force microscopy

C. Williams, L. Klein, 2004 .

Electron tunneling detected by electrostatic force

C. Williams, Jung-hyung Kim, L. Klein, 2000 .

A three-dimensional model of single-electron tunneling between a conductive probe and a localized electronic state in a dielectric

C. Williams, E. Mishchenko, N. Zheng, 2007 .

Differential scanning tunnelling microscopy

H. K. Wickramasinghe, D. Abraham, C. Williams, 1988 .

Single-electron manipulation to and from a SiO2 surface by electrostatic force microscopy

C. Williams, N. Zheng, E. Bussmann, 2005 .

Imaging of localized electronic states at a nonconducting surface by single-electron tunneling force microscopy.

C. Williams, N. Zheng, E. Bussmann, 2006, Nano letters.

Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

Hemantha K. Wickramasinghe, Clayton C. Williams, Y. Martin, 1987 .

Photothermal Imaging with Sub-100-nm Spatial Resolution

H. K. Wickramasinghe, C. Williams, 1988 .

Noise reduction technique for scanning tunneling microscopy

H. K. Wickramasinghe, D. Abraham, C. Williams, 1988 .

Direct comparison of two-dimensional dopant profiles by scanning capacitance microscopy with TSUPREM4 process simulation

J. Kim, J. McMurray, C. Williams, 1998 .

Scanning capacitance microscopy on a 25 nm scale

S. Rishton, C. Williams, W. P. Hough, 1989 .

Consecutive Charging of a Molecule-on-Insulator Ensemble Using Single Electron Tunnelling Methods.

C. Williams, R. Steele, P. Rahe, 2016, Nano letters.

SCANNING CAPACITANCE MICROSCOPE METHODOLOGY FOR QUANTITATIVE ANALYSIS OF P-N JUNCTIONS

Clayton C. Williams, J. McMurray, C. Williams, 1999 .

Noise in scanning capacitance microscopy measurements

J. McMurray, C. Williams, V. Zavyalov, 2000 .

Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy

Hemantha K. Wickramasinghe, Clayton C. Williams, James A. Slinkman, 1989 .

Epitaxial staircase structure for the calibration of electrical characterization techniques

Trudo Clarysse, Wilfried Vandervorst, Clayton C. Williams, 1998 .

Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes

Clayton C. Williams, Ezra Bussmann, C. Williams, 2004 .

Dopant characterization round-robin study performed on two-dimensional test structures fabricated at Texas Instruments

D. Thomson, W. Vandervorst, P. Wolf, 1998 .

Imaging of Bandtail States in Silicon Heterojunction Solar Cells: Nanoscopic Current Effects on Photovoltaics

K. Lips, B. Stannowski, C. Williams, 2020, 2008.11413.

Scanning Probe Microscopies II

C. Williams, 1993 .

Phase Segregation in Thin Films of Conjugated Polyrotaxane– Poly(ethylene oxide) Blends: A Scanning Force Microscopy Study

F. Cacialli, C. Williams, P. Samorí, 2007 .

Measurement of in‐plane magnetization by force microscopy

H. K. Wickramasinghe, D. Abraham, C. Williams, 1988 .

Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface

C. Williams, E. Bussmann, 2006 .

Micromachined submicrometer photodiode for scanning probe microscopy

Clayton C. Williams, Robert C. Davis, Pavel Neuzil, 1995 .

Molecular charge mapping with electrostatic force microscope

Clayton C. Williams, Yaojian Leng, C. Williams, 1993, Photonics West - Lasers and Applications in Science and Engineering.

Atomic-Scale Imaging of Dielectric Point Defects

C. Williams, 2013 .

In situ absolute magnetometry in an UHV scanning probe microscope using conducting polymer-thin film

C. Williams, C. Boehme, Kapildeb Ambal, 2017 .

Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures

D. Adderton, A. Erickson, C. Williams, 1996 .

Single electron tunneling detected by electrostatic force

C. Williams, L. Klein, 2001 .

Spin-Relaxation Dynamics ofE′Centers at High Density inSiO2Thin Films for Single-Spin Tunneling Force Microscopy

A. Payne, C. Williams, C. Boehme, 2015 .

Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy

D. J. Kim, C. Williams, E. Bussmann, 2004 .

Two dimensional dopant and carrier profiles obtained by scanning capacitance microscopy on an actively biased cross-sectioned metal-oxide-semiconductor field-effect transistor

J. McMurray, C. Williams, V. Zavyalov, 2000 .

High-resolution force microscopy of in-plane magnetization

H. K. Wickramasinghe, D. Abraham, C. Williams, 1988 .