Han-Su Kim

Effects of Parasitic Capacitance, External Resistance, and Local Stress on the RF Performance of the Transistors Fabricated by Standard 65-nm CMOS Technologies

Han-Su Kim, Jedon Kim, Chulho Chung, 2008, IEEE Transactions on Electron Devices.

Five-Step (Pad–Pad Short–Pad Open–Short–Open) De-Embedding Method and Its Verification

Chulho Chung, In Man Kang, Kyu-Myung Choi, 2009, IEEE Electron Device Letters.