T. Mattila
发表
T. Laurila,
T. Mattila,
J. Kivilahti,
2006
.
T. Mattila,
J. Kivilahti,
2006
.
T. Mattila,
J. Kivilahti,
V. Vuorinen,
2004
.
M. Paulasto-Krockel,
T. Mattila,
Jue Li,
2014,
Journal of Microelectromechanical Systems.
J. Li,
J. Hokka,
J. Meng,
2013,
2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
P. Marjamaki,
T. Mattila,
J. Kivilahti,
2006,
IEEE Transactions on Components and Packaging Technologies.
J. Li,
M. Broas,
M. Paulasto-Krockel,
2015,
2015 IEEE 65th Electronic Components and Technology Conference (ECTC).
T. Mattila,
A. Dasgupta,
S. Mukherjee,
2012,
13th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.
T. Laurila,
T. Mattila,
J. Kivilahti,
2012
.
Heikki Saari,
Mikael Broas,
Jussi Hokka,
2013,
Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.
T. Mattila,
M. Paulasto-Kröckel,
Xuwen Liu,
2015
.
T. Laurila,
T. Mattila,
J. Kivilahti,
2012
.
T. Laurila,
T. Mattila,
J. Kivilahti,
2012
.
L. Skogström,
T. Mattila,
V. Vuorinen,
2020,
Handbook of Silicon Based MEMS Materials and Technologies.
Toni T. Mattila,
Jue Li,
Vesa Vuorinen,
2015
.
T. Laurila,
T. Mattila,
J. Kivilahti,
2007
.
T. T. Mattila,
T. Mattila,
2005
.
X. W. Liu,
J. Li,
T. Mattila,
2009,
2009 International Conference on Electronic Packaging Technology & High Density Packaging.
Jue Li,
Toni T. Mattila,
Tomi Laurila,
2007,
Microelectron. Reliab..
T. Laurila,
T. Mattila,
J. Kivilahti,
2005
.
T. Laurila,
T. Mattila,
J. Kivilahti,
2010
.
T. Mattila,
J. Kivilahti,
Hao Yu,
2006,
IEEE Transactions on Components and Packaging Technologies.
Toni T. Mattila,
J. Li,
Mervi Paulasto-Kröckel,
2010,
Microelectronics Reliability.
Jussi Hokka,
Toni T. Mattila,
Hongbo Xu,
2013,
Journal of Electronic Materials.
Jorma Kivilahti,
T. T. Mattila,
T. Mattila,
2005
.
Jue Li,
Jussi Hokka,
Toni T. Mattila,
2012,
Microelectron. Reliab..
Replacement of the drop test with the vibration test — The effect of test temperature on reliability
T. Mattila,
J. Kivilahti,
T.T. Mattila,
2008,
2008 58th Electronic Components and Technology Conference.
J. E. Morris,
T. Mattila,
J. McCarthy,
2010,
2010 11th International Conference on Electronic Packaging Technology & High Density Packaging.
J. E. Morris,
T. Mattila,
Sini Niiranen,
2010,
33rd International Spring Seminar on Electronics Technology, ISSE 2010.
Jussi Hokka,
Toni T. Mattila,
Esa Hussa,
2014,
Microelectron. Reliab..
T. Mattila,
J. Kivilahti,
T T Mattila,
2010,
IEEE Transactions on Components and Packaging Technologies.
Jussi Hokka,
Toni T. Mattila,
Mervi Paulasto-Kröckel,
2014,
Journal of Electronic Materials.
T. Mattila,
J. Kivilahti,
2012
.
K.-J. Wolter,
M. Paulasto-Krockel,
T. T. Mattila,
2010,
3rd Electronics System Integration Technology Conference ESTC.
T. Laurila,
T. Mattila,
J. Kivilahti,
2012
.
Toni T. Mattila,
Mervi Paulasto-Kröckel,
J. Li,
2012,
Microelectron. Reliab..
Toni T. Mattila,
Mervi Paulasto-Kröckel,
T. Mattila,
2011,
Microelectron. Reliab..
Jussi Hokka,
Hongbo Xu,
Mervi Paulasto-Kröckel,
2013,
Journal of Electronic Materials.
T. Laurila,
T. Mattila,
J. Kivilahti,
2012
.
Jussi Hokka,
Toni T. Mattila,
Esa Hussa,
2014,
Microelectron. Reliab..