J. Paul
发表
S. Slesazeck,
T. Mikolajick,
U. Schroeder,
2014,
IEEE Transactions on Electron Devices.
T. Mikolajick,
M. Goldbach,
J. Muller,
2013,
IEEE Transactions on Electron Devices.
S. Slesazeck,
T. Mikolajick,
J. Muller,
2012,
2012 Symposium on VLSI Technology (VLSIT).
Sergei V. Kalinin,
S. Kalinin,
T. Mikolajick,
2013,
2013 IEEE International Electron Devices Meeting.
S. Slesazeck,
T. Mikolajick,
U. Schroeder,
2014,
2014 IEEE International Reliability Physics Symposium.
S. Flachowsky,
H. Mulaosmanovic,
S. Slesazeck,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
M. Freitag,
J. Paul,
C. Hohle,
2013
.
W. Weinreich,
J. Paul,
J. Sundqvist,
2013,
2013 International Semiconductor Conference Dresden - Grenoble (ISCDG).
J. Paul,
R. Hoffmann,
M. Czernohorsky,
2010,
IEEE Transactions on Electron Devices.
M. F. Beug,
J. Paul,
T. Melde,
2011,
IEEE Transactions on Electron Devices.
T. Schloesser,
S. Slesazeck,
U. Schroeder,
2013,
2012 13th International Conference on Ultimate Integration on Silicon (ULIS).
T. Schloesser,
S. Slesazeck,
U. Schroeder,
2012
.
M. Hove,
D. Dwyer,
J. Paul,
1993
.
Sven Beyer,
Martin Trentzsch,
Thomas Mikolajick,
2020,
2020 IEEE International Memory Workshop (IMW).
M. Trentzsch,
S. Flachowsky,
R. Richter,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
Thomas Mikolajick,
Jan Paul,
Milan Pesic,
2016,
IEEE Transactions on Electron Devices.
HfO2-Based Ferroelectric Field-Effect Transistors with 260 nm Channel Length and Long Data Retention
R. Hoffmann,
M. Trentzsch,
S. Slesazeck,
2012,
2012 4th IEEE International Memory Workshop.
M. F. Beug,
T. Mikolajick,
S. Wege,
2009
.
T. Herrmann,
A. Zaka,
M. Trentzsch,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
S. Henker,
Stefan Slesazeck,
Thomas Mikolajick,
2016
.