Main-gwo Chen

Effects of Delay Time and AC Factors on Negative Bias Temperature Instability of PMOSFETs

Jih-San Li, Main-gwo Chen, P. Juan, 2006, 2006 IEEE International Integrated Reliability Workshop Final Report.

Comparison of electrical and reliability characteristics of different 14 /spl Aring/ oxynitride gate dielectrics

T. Pan, Main-gwo Chen, Chuan-Hsi Liu, 2002 .

Electrical Characterization and Dielectric Properties of Metal–Oxide–Semiconductor Structures Using High-κ CeZrO4 Ternary Oxide as Gate Dielectric

Main-gwo Chen, P. Juan, Cheng-li Lin, 2009 .