S. Rauch
发表
F. Guarín,
S. Rauch,
2015
.
S. Rauch,
Stewart E. Rauch,
2007,
IEEE Transactions on Device and Materials Reliability.
R. Wong,
J. Sudijono,
S. Rauch,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
G. Larosa,
F. Guarín,
S. Rauch,
1998,
IEEE Electron Device Letters.
E. Crabbé,
F. Guarín,
S. Rauch,
1997,
1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.
T. Grasser,
B. Kaczer,
J. Franco,
2017,
IEEE Electron Device Letters.
F. Guarín,
S. Rauch,
G. La Rosa,
2000,
Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474).
F. Guarín,
S. Rauch,
G. La Rosa,
1999,
IEEE Electron Device Letters.
S. Rauch,
2014
.
S. Rauch,
R. N. Steinbicker,
1973
.
S.E. Rauch,
S. Rauch,
G. La Rosa,
2005,
IEEE Transactions on Device and Materials Reliability.
Giuseppe La Rosa,
Stewart E. Rauch,
S. Rauch,
2007,
Microelectron. Reliab..
S.E. Rauch,
S. Rauch,
G. La Rosa,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
T. Sullivan,
E. Wu,
R. Vollertsen,
2009
.
G. Biery,
S. Narasimha,
J. Adkisson,
2001,
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).
E. Nowak,
A. Ray,
P. Agnello,
1996,
1996 Symposium on VLSI Technology. Digest of Technical Papers.
Prateek Sharma,
Tibor Grasser,
Jacopo Franco,
2016,
2016 46th European Solid-State Device Research Conference (ESSDERC).
Fernando Guarin,
F. Guarín,
S. Rauch,
2001
.
S. Rauch,
1976
.