C. Poulain

发表

Silver nanoparticle inkjet printed 17 GHz filter

D. Mercier, D. Sette, A. Blayo, 2013, 2013 IEEE MTT-S International Microwave Symposium Digest (MTT).

Performance Limits of Nanoelectromechanical Switches (NEMS)-Based Adiabatic Logic Circuits

Alexandre Valentian, Samer Houri, Christophe Poulain, 2013 .

An Original Apparatus for Endurance Testing of MEMS Electrical Contact Materials

C. Poulain, J. Delamare, F. Houzé, 2009, 2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts.

Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches

D. Mariolle, C. Poulain, J. Delamare, 2015 .

Experimental Quantification of the Residual Stress of Thin Membrane Materials in MEMS Devices Using Point Deflection

S. Moreau, S. Fanget, A. Pouydebasque, 2014 .

Bow management with temperature for thin chips integration

S. Moreau, J. Charbonnier, R. Hida, 2013, 2013 Eurpoean Microelectronics Packaging Conference (EMPC).

Effects of gamma radiation on suspended silicon nanogauges bridge used for MEMS transduction

P. Rey, C. Poulain, J. Armani, 2020 .

Study of the Electrical Contact in a Fully Inkjet Printed Membrane Switch

D. Sette, A. Blayo, C. Poulain, 2013, 2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013).

Experimental Validation of a 2-D Constriction Resistance Model at the Microscale

R. Anciant, C. Poulain, L. Bilhaut, 2009, 2009 Proceedings of the 55th IEEE Holm Conference on Electrical Contacts.

Characterization and modeling of a piezoresistive three-axial force micro sensor

Patrice Rey, C. Coutier, Nouha Alcheikh, 2013 .

Characterization of a highly sensitive silicon based three-axial piezoresistive force sensor

N. Al Cheikh, C. Coutier, J. Brun, 2012, 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG).

Deviations from the Paschen's law at short gap distances from 100 nm to 10 μm in air and nitrogen

O. Lesaint, C. Poulain, N. Bonifaci, 2014 .

Impact of the resist properties on the antisticking layer degradation in UV nanoimprint lithography

J. Boussey, Marc Zelsmann, A. Francone, 2010 .

CIGS solar cells on ultra-thin glass substrates: Determination of mechanical properties by nanoindentation and application to bending-induced strain calculation

C. Poulain, F. Emieux, L. Grenet, 2017 .

Resilience to Vibration of a Tuning Fork MEMS Gyroscope

Guillaume Jourdan, Patrice Rey, Thierry Verdot, 2016 .

Total Harmonic Distortion of a Piezoelectric MEMS Loudspeaker in an IEC 60318-4 Coupler Estimation Using Static Measurements and a Nonlinear State Space Model

C. Poulain, F. Casset, S. Durand, 2021, Micromachines.

NEMS switches for ultra-low-power digital logic: Challenges and opportunities

L. Hutin, W. Ludurczak, J. L. Munoz-Gamarra, 2016, 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO).

Conducting Probe Atomic Force Microscope as a Relevant Tool for Studying Some Phenomena in MEMS Switches

D. Mariolle, C. Poulain, F. Houzé, 2015, Sensing and Imaging.

A new experimental methodology using point deflection to quantify residual stress of thin polymer membrane materials in MEMS devices

Stéphane Moreau, Stephane Fanget, Christophe Poulain, 2013, The 8th Annual IEEE International Conference on Nano/Micro Engineered and Molecular Systems.

Contact degradation due to material transfer in MEM switches

C. Poulain, A. Peschot, F. Souchon, 2012, Microelectron. Reliab..

A Nano-Scale Investigation of Material Transfer Phenomena at Make in a MEMS Switch

Christophe Poulain, Alexis Peschot, Nelly Bonifaci, 2011, 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm).

Field emission and material transfer in microswitches electrical contacts

Jérôme Delamare, Christophe Poulain, Frédéric Houzé, 2010 .

Contact Bounce Phenomena in a MEM Switch

C. Poulain, A. Peschot, N. Bonifaci, 2012, 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm).

An experimental method to determine the resistance of a vertically aligned carbon nanotube forest in contact with a conductive layer

D. Mariolle, C. Poulain, J. Dijon, 2012 .

Impact of Creep and Softening Mechanisms on the Contact Resistance of RF MEMS Ohmic Switches: Study of the Current and Time Effects on Au-to-Au Microcontacts in Static Contact Conditions

Christophe Poulain, Alexis Peschot, Frederic Souchon, 2010, 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts.

Electrical breakdown voltage in micro- and submicrometer contact gaps (100nm - 10µm) in air and nitrogen

O. Lesaint, C. Poulain, N. Bonifaci, 2015, 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm).