J. Brini

发表

Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance

F. Balestra, S. Cristoloveanu, M. Benachir, 1987, IEEE Electron Device Letters.

Simple parameter extraction method for non-ideal Schottky barrier diodes

Jean Brini, Charalabos A. Dimitriadis, J. Brini, 1998 .

Analytical models of subthreshold swing and threshold voltage for thin- and ultra-thin-film SOI MOSFETs

Gerard Ghibaudo, J. Brini, Francis Balestra, 1990 .

Impact of scaling down on low frequency noise in silicon MOS transistors

G. Ghibaudo, J. Brini, O. Roux‐dit‐Buisson, 1992 .

Grain and grain-boundary control of the transfer characteristics of large-grain polycrystalline silicon thin-film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 2000 .

Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors

Jean Brini, J. Stoemenos, Charalabos A. Dimitriadis, 1999 .

Electrical and noise properties of thin-film transistors on very thin excimer laser annealed polycrystalline silicon films

G. Kamarinos, J. Brini, C. Dimitriadis, 1999 .

Improved Analysis of Low Frequency Noise in Field‐Effect MOS Transistors

Gerard Ghibaudo, J. Brini, Francis Balestra, 1991 .

Low frequency noise spectroscopy in MOS and bipolar devices

Jean Brini, J. Brini, 1998 .

Reversibility of charge trapping and SILC creation in thin oxides after stress/anneal cycling

Jean Brini, Gerard Ghibaudo, G. Pananakakis, 1998 .

Conduction and low-frequency noise in high temperature processed polycrystalline silicon thin film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 1998 .

Study of leakage current in n-channel and p-channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements

G. Kamarinos, J. Brini, C. Dimitriadis, 1997 .

Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 2000 .

Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 1999 .

Low-frequency noise of the leakage current in undoped low-pressure chemical vapor deposited polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 1997 .

Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 2001 .

Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 2000 .

Stability of hydrogenated in pure hydrogen plasma p-channel polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 2003 .

Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering

G. Kamarinos, J. Brini, J. I. Lee, 1999 .

On-current modeling of large-grain polycrystalline silicon thin-film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 2001 .

Direct extraction of McWhorter's constant from LFN spectra of MOSFETs with planar layers of Si nanocrystals embedded in gate SiO2

Jacques Zimmermann, Stéphane Ferraton, Jan Chroboczek, 2004, SPIE International Symposium on Fluctuations and Noise.

Investigation of Drain Current RTS Noise in Small Area Silicon MOS Transistors

G. Ghibaudo, E. Simoen, B. Dierickx, 1991, ESSDERC '91: 21st European Solid State Device Research Conference.

Modeling of contuctance fluctuations in small area metal–oxide–semiconductor transistors

Jean Brini, Gerard Ghibaudo, O. Roux, 1991 .

Investigation of floating body effects in silicon‐on‐insulator metal‐oxide‐semiconductor field‐effect transistors

Sorin Cristoloveanu, Jean Brini, Gerard Ghibaudo, 1991 .

Low-frequency noise in polycrystalline semiconducting FeSi2 thin films

A. Birbas, G. Kamarinos, J. Brini, 1999 .

Low frequency noise in β-FeSi2/n-Si heterojunctions

G. Kamarinos, J. Brini, C. Dimitriadis, 1998 .

Empirical relationship between low-frequency drain current noise and grain-boundary potential barrier height in high-temperature-processed polycrystalline silicon thin-film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 2000 .

The unijunction transistor used as a high sensitivity magnetic sensor

G. Kamarinos, J. Brini, 1981 .

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

Jean Brini, N. A. Hastas, Charalabos A. Dimitriadis, 2002 .

Threshold voltage and subthreshold slope of the volume-inversion MOS transistor

Gerard Ghibaudo, J. Brini, Francis Balestra, 1991 .

Modelling and simulation of single and double gate thin film SOI MOSFETs

G. Ghibaudo, F. Balestra, M. Benachir, 1989, IEEE SOS/SOI Technology Conference.

Avalanche-induced excess noise in polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, C. Dimitriadis, 1999 .

Influence of quadratic mobility degradation factor on low frequency noise in MOS transistors

Jean Brini, Gerard Ghibaudo, P. Morfouli, 1998 .

Low-frequency noise sources in polysilicon emitter BJT's: influence of hot-electron-induced degradation and post-stress recovery

G. Ghibaudo, F. Balestra, A. Chantre, 1995 .

Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors

G. Kamarinos, J. Brini, G. Kamarinos, 2001, IEEE Electron Device Letters.

Scaling down and low‐frequency noise in MOSFET’s. Are the RTS’s the ultimate components of the 1/f noise?

Gerard Ghibaudo, J. Brini, G. Kamarinos, 2008 .

Contacts of titanium nitride to n- and p-type gallium nitride films

G. Kamarinos, J. Brini, T. Karakostas, 1999 .

1/fγ noise in polycrystalline silicon thin-film transistors

Jean Brini, Charalabos A. Dimitriadis, Georges Kamarinos, 1999 .

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors

C. A. Dimitriadis, N. A. Hastas, G. Kamarinos, 2003, Microelectron. Reliab..

Hot-carrier phenomena in high temperature processed undoped-hydrogenated n-channel polysilicon thin film transistors (TFTs)

G. Kamarinos, J. Brini, C. Dimitriadis, 1999 .

On the tunneling component of charge pumping current in ultrathin gate oxide MOSFETs

J. Brini, P. Masson, J. Autran, 1999, IEEE Electron Device Letters.

Measurement and modeling of the annealing kinetics of stress induced leakage current in ultra-thin oxides

Jean Brini, Gerard Ghibaudo, G. Pananakakis, 1999 .