M. Cho
发表
A. Hikavyy,
G. Mannaert,
T. Schram,
2011,
2011 International Electron Devices Meeting.
S. Chew,
T. Schram,
K. Devriendt,
2014
.
M. Jurczak,
P. Fazan,
M. Aoulaiche,
2014,
IEEE Transactions on Electron Devices.
T. Grasser,
B. Kaczer,
G. Groeseneken,
2011
.
T. Grasser,
B. Kaczer,
G. Groeseneken,
2011
.
N. Horiguchi,
R. Degraeve,
T. Grasser,
2014,
Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
R. Degraeve,
B. Govoreanu,
M. Jurczak,
2009
.
B. Kaczer,
T. Grasser,
L. Witters,
2013,
IEEE Transactions on Electron Devices.
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE Electron Device Letters.
A. Hikavyy,
N. Horiguchi,
L. Ragnarsson,
2011,
2011 International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2012,
IEEE Transactions on Electron Devices.
N. Collaert,
D. Linten,
R. Rooyackers,
2017,
IEEE Transactions on Device and Materials Reliability.
B. Kaczer,
J. Mitard,
G. Groeseneken,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
B. Parvais,
S. Biesemans,
T. Schram,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
B. Kaczer,
T. Grasser,
G. Eneman,
2010,
2010 IEEE International Reliability Physics Symposium.
R. Degraeve,
B. Kaczer,
T. Grasser,
2010,
2010 International Electron Devices Meeting.
Moonju Cho,
B Kaczer,
J Franco,
2010,
2010 IEEE International Reliability Physics Symposium.
H. Mertens,
A. Thean,
N. Collaert,
2014,
2014 IEEE International Electron Devices Meeting.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2011,
IEEE Transactions on Electron Devices.
R. Ritzenthaler,
N. Horiguchi,
A. Thean,
2013
.
R. Degraeve,
B. Kaczer,
F. Crupi,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
N. Horiguchi,
M. Togo,
B. Lee,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
K. B. Noh,
R. Ritzenthaler,
T. Schram,
2014
.
N. Horiguchi,
A. Thean,
A. Veloso,
2013,
ACS applied materials & interfaces.
B. Kaczer,
G. Groeseneken,
E. Bury,
2015
.
L. Ragnarsson,
B. Kaczer,
G. Groeseneken,
2013,
IEEE Electron Device Letters.
T. Grasser,
B. Kaczer,
G. Eneman,
2013
.
R. Ritzenthaler,
N. Horiguchi,
B. Kaczer,
2013,
IEEE Electron Device Letters.
R. Degraeve,
G. Groeseneken,
T. Kauerauf,
2010,
2010 IEEE International Reliability Physics Symposium.
R. Degraeve,
L. Ragnarsson,
T. Grasser,
2010
.
E. Simoen,
R. Ritzenthaler,
N. Horiguchi,
2014,
2014 IEEE International Electron Devices Meeting.
R. Ritzenthaler,
T. Schram,
N. Horiguchi,
2016
.
N. Horiguchi,
A. Thean,
A. Veloso,
2013,
IEEE Transactions on Electron Devices.
S. Chew,
T. Schram,
K. Devriendt,
2012,
Symposium on VLSI Technology.
Naoto Horiguchi,
Wilfried Vandervorst,
Tom Schram,
2014,
IEEE Transactions on Electron Devices.
Naoto Horiguchi,
Eddy Simoen,
Aaron Thean,
2013,
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
C. Hwang,
A. Delabie,
J. Han,
2014
.
Eddy Simoen,
Philippe Roussel,
Guido Groeseneken,
2010
.
R. Degraeve,
B. Kaczer,
B. Govoreanu,
2008,
2008 IEEE International Electron Devices Meeting.
R. Degraeve,
L. Ragnarsson,
M. Aoulaiche,
2011
.
R. Degraeve,
C. Adelmann,
L. Ragnarsson,
2011
.
Jacopo Franco,
Tom Schram,
Marc Aoulaiche,
2014,
2014 44th European Solid State Device Research Conference (ESSDERC).
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
Dimitri Linten,
Philippe Roussel,
Tibor Grasser,
2016
.
Francky Catthoor,
Dimitri Linten,
Philippe Roussel,
2015,
2015 45th European Solid State Device Research Conference (ESSDERC).
R. Degraeve,
B. Kaczer,
A. Akheyar,
2009,
2009 IEEE International Reliability Physics Symposium.
R. Degraeve,
M. Alam,
A. Islam,
2011,
2011 International Reliability Physics Symposium.
Byoung Hun Lee,
L. Pantisano,
T. Chiarella,
2012,
IEEE Electron Device Letters.
E. Simoen,
E. Vecchio,
H. Bender,
2013,
2013 Symposium on VLSI Technology.
Aaron Thean,
Philippe Matagne,
Anda Mocuta,
2014,
IEEE Electron Device Letters.
Naoto Horiguchi,
Eddy Simoen,
Anabela Veloso,
2014
.
Naoto Horiguchi,
Philippe Roussel,
Guido Groeseneken,
2013,
IEEE Transactions on Electron Devices.
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
R. Degraeve,
G. Groeseneken,
P. Roussel,
2010
.
E. Simoen,
G. Hellings,
E. Vecchio,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
T. Schram,
R. Degraeve,
B. O’Sullivan,
2009
.
Naoto Horiguchi,
Jerome Mitard,
Eddy Simoen,
2016,
IEEE Transactions on Electron Devices.
H. Bender,
G. Eneman,
N. Horiguchi,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
A. Thean,
N. Collaert,
A. Veloso,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).