Y. Le Friec

50 nm-Gate All Around (GAA)-Silicon On Nothing (SON)-devices: a simple way to co-integration of GAA transistors within bulk MOSFET process

T. Skotnicki, D. Dutartre, P. Ribot, 2002, 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).

Reliability failure modes in interconnects for the 45 nm technology node and beyond

E. Petitprez, E. Richard, Y. Le Friec, 2009, 2009 IEEE International Interconnect Technology Conference.

Crystallization of Ge-Rich GeSbTe Alloys: The Riddle Is Solved

D. Benoit, A. Claverie, Y. Le Friec, 2022, ACS Applied Electronic Materials.

Highly-performant 38 nm SON (silicon-on-nothing) P-MOSFETs with 9 nm-thick channels

M. Haond, T. Skotnicki, S. Monfray, 2002, 2002 IEEE International SOI Conference.

Truly Innovative 28nm FDSOI Technology for Automotive Micro-Controller Applications embedding 16MB Phase Change Memory

P. Mattavelli, R. Ranica, P. Boivin, 2018, 2018 IEEE International Electron Devices Meeting (IEDM).