Marcello Traiola
发表
Alberto Bosio,
Mario Barbareschi,
Marcello Traiola,
2018,
Microelectron. Reliab..
Elena I. Vatajelu,
Alberto Bosio,
Said Hamdioui,
2017,
2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS).
Nikolaos I. Deligiannis,
M. Reorda,
Marcello Traiola,
2021,
IEEE Access.
Marcello Traiola,
A. Bosio,
A. Ruospo,
2022,
2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS).
Alberto Bosio,
Petr Fiser,
Cédric Marchand,
2021,
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Riccardo Cantoro,
Matteo Sonza Reorda,
Emanuele Valea,
2020,
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Alberto Bosio,
Ernesto Sanchez,
Annachiara Ruospo,
2021,
Microprocess. Microsystems.
Arnaud Virazel,
Alberto Bosio,
Mario Barbareschi,
2019,
IEEE Transactions on Nanotechnology.
Lucas Matana Luza,
A. Bosio,
Marcello Traiola,
2023,
Computer.
A. Bosio,
Jie Han,
Marcello Traiola,
2022,
ACM J. Emerg. Technol. Comput. Syst..
Alberto Bosio,
Luigi Dilillo,
Annachiara Ruospo,
2021,
2021 IEEE 22nd Latin American Test Symposium (LATS).
Jürgen Teich,
Muhammad Abdullah Hanif,
Arnaud Virazel,
2021,
2021 IEEE European Test Symposium (ETS).
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2020,
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).
A. Bosio,
P. Girard,
A. Virazel,
2023
.
Alessandro Savino,
Alberto Bosio,
Stefano Di Carlo,
2021,
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Alberto Bosio,
Mario Barbareschi,
Patrick Girard,
2020,
Proceedings of the IEEE.
A. Bosio,
A. Savino,
L. Sekanina,
2020,
2020 IEEE European Test Symposium (ETS).
Alessandro Savino,
Stefano Di Carlo,
Marcello Traiola,
2019,
Microelectronics Reliability.
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2018,
2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Alessandro Savino,
Alberto Bosio,
Stefano Di Carlo,
2018,
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS).
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2018,
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2018,
2018 IEEE 19th Latin-American Test Symposium (LATS).
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2017,
2017 IEEE East-West Design & Test Symposium (EWDTS).
L. Anghel,
A. Bosio,
Marcello Traiola,
2017,
2017 International Mixed Signals Testing Workshop (IMSTW).
Arnaud Virazel,
Alberto Bosio,
Patrick Girard,
2017,
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).
Arnaud Virazel,
Alberto Bosio,
Mario Barbareschi,
2017
.
Lucas Matana Luza,
A. Bosio,
Marcello Traiola,
2023,
Computer.
Marcello Traiola,
Marcello Traiola,
2019
.