C. Park

发表

Accurate analysis of conduction and resistive-switching mechanisms in double-layered resistive-switching memory devices

Byung-Gook Park, Sung-Joo Hong, Jong-Ho Lee, 2012 .

Particle simulation of electrolytic ion motions for noise in electrolyte–insulator–semiconductor field-effect transistors

M. Seo, I. Chung, Jungwoo Lee, 2016 .

Characterization of traps and trap-related effects in recessed-gate normally-off AlGaN/GaN-based MOSHEMT

U. Chung, Jong-Ho Lee, Jongseob Kim, 2012, 2012 International Electron Devices Meeting.

Design of an X-band Oscillator Using Novel Miniaturized Microstrip Hairpin Resonator

Jinho Jeong, C. Park, Jinho Jeong, 2007, 2007 Asia-Pacific Microwave Conference.

Modeling of ΔIBL due to random telegraph noise with considering bit-line interference in NAND flash memory

Jong-Ho Lee, C. Park, J. Bae, 2014 .

Modeling of thermal noise in short-channel MOSFETs at saturation

Young June Park, Y. J. Park, C. Park, 2000 .

Relationship Between Conduction Mechanism and Low-Frequency Noise in Polycrystalline- $\hbox{TiO}_{x}$-Based Resistive-Switching Memory Devices

C. Hwang, Jong-Ho Lee, H. Kwon, 2012, IEEE Electron Device Letters.

Analysis of Sensing Mechanisms in a Gold-Decorated SWNT Network DNA Biosensor

C. Park, Young June Park, S. Kim, 2014 .

Governing equations of the terminal current Green’s functions and their application to derivation of the Nyquist theorem for multiterminal semiconductor devices

H. Min, C. Park, Sung-Min Hong, 2007 .

NANOCAD Framework for Simulation of Quantum Effects in Nanoscale MOSFET Devices

I. Chung, H. Min, Seonghoon Jin, 2006 .

Physics-Based Analysis and Simulation of $\hbox{1}/f$ Noise in MOSFETs Under Large-Signal Operation

Hong Shick Min, Sung-Min Hong, Young June Park, 2010, IEEE Transactions on Electron Devices.

Flicker Noise Behavior in Resistive Memory Devices With Double-Layered Transition Metal Oxide

Byung-Gook Park, Sung-Joo Hong, J. Roh, 2013, IEEE Electron Device Letters.

Influence of magnetic field on 1/ f noise and thermal noise in multi-terminal homogeneous semiconductor resistors and discrimination between the number fluctuation model and the mobility fluctuation model for 1/ f noise in bulk semiconductors

Hong Shick Min, Young June Park, H. Min, 2004 .

Formulas of 1/f noise in Schottky barrier diodes under reverse bias

Jong-Ho Lee, C. Park, 2012 .

A unified approach for the reliability modeling of MOSFETs

Sung-Min Hong, Young June Park, Chang-Ki Baek, 2008, 2008 International Conference on Simulation of Semiconductor Processes and Devices.

An explicit rederivation of Reimbold's 1/f trapping noise theory in Si nMOSFETs at weak inversion

C. Park, Y. Park, 1999 .

Filtering technique to lower phase noise for 2.4GHz CMOS VCO

C. Park, Chan Hyeong Park, Wenhao Yan, 2008, 2008 9th International Conference on Solid-State and Integrated-Circuit Technology.

Statistical analysis of random telegraph noise in CMOS image sensors

Hong Shick Min, Sung-Min Hong, Young June Park, 2008, 2008 International Conference on Simulation of Semiconductor Processes and Devices.

Physics-Based Phase Noise Analysis of CMOS RF Oscillators

Myoung Jin Lee, H. Min, C. Park, 2006, 2006 International Conference on Simulation of Semiconductor Processes and Devices.

A Physics-Based TCAD Framework for the Noise Analysis of RF CMOS Circuits under the Large-Signal Operation

Hong Shick Min, Young-June Park, Sung-Min Hong, 2005, 2005 International Conference On Simulation of Semiconductor Processes and Devices.

Governing Equations of the Green’s Functions for the Short‐Circuit Terminal Noise Currents in Semiconductor Devices

H. Min, C. Park, Sung-Min Hong, 2005 .

Extension of the characteristic potential method for noise calculation and its application to shot noise in semiconductor devices

Hong S. Min, Sung-Min Hong, Chan H. Park, 2004, SPIE International Symposium on Fluctuations and Noise.

Physics-Based Simulation of 1/f Noise in MOSFETs under Large-Signal Operation

Hong Shick Min, Young June Park, Sung-Min Hong, 2007 .

Generation-recombination voltage noise spectrum in uniformly doped majority-carrier semiconductor samples

I. Chung, C. Park, 2018, Journal of Applied Physics.