Youbean Kim

发表

Built-in Self-test for A/D Converters in the Presence of Transient Zones

Sungho Kang, In-Cheol Kim, Kicheol Kim, 2007 .

High Correlative Low Power Test Pattern Generator Using a Transition Monitoring Window

Sungho Kang, Myung-Hoon Yang, Youbean Kim, 2005 .

A New Analog-to-Digital Converter BIST Considering a Transient Zone

Sungho Kang, Incheol Kim, Kicheol Kim, 2007, IEICE Trans. Electron..

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST

Sungho Kang, Incheol Kim, Kicheol Kim, 2008, IEICE Trans. Inf. Syst..

Core Technologies Derivation of Fusion DEMO Reactor Applying TRL and AHP

Wonjae Choi, Youbean Kim, Hansoo Chang, 2014 .

Pattern Mapping Method for Low Power BIST

Jaewon Jang, Sungho Kang, Youbean Kim, 2009 .

Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing

Sungho Kang, D. Lee, Myung-Hoon Yang, 2007, IET Comput. Digit. Tech..

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals

Sungho Kang, Incheol Kim, Kicheol Kim, 2008, IEICE Trans. Electron..

A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

Sungho Kang, Incheol Kim, Jaewon Jang, 2009, 2009 International SoC Design Conference (ISOCC).

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters

Sungho Kang, Incheol Kim, Kicheol Kim, 2008, IEICE Trans. Electron..

A New Low Power BIST Architecture Based on Probability Models

In-Cheol Kim, Kicheol Kim, Sungho Kang, 2007 .

An Efficient BIST (Built-in Self-test) for A/D converters

Sungho Kang, In-Cheol Kim, Kicheol Kim, 2007 .

Variable-length block nine-coded compression technique with Huffman codes and symbol merging

Sungho Kang, Incheol Kim, Jaewon Jang, 2008, 2008 International SoC Design Conference.

Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method

Sungho Kang, Youbean Kim, Jaewon Jang, 2010, IEICE Trans. Inf. Syst..

A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture

Sungho Kang, Yong Lee, Myung-Hoon Yang, 2005, 14th Asian Test Symposium (ATS'05).

An Improved False Aggressor Pruning Algorithm for Effective Crosstalk Tests

Kyungmin Kim, Sungho Kang, Youbean Kim, 2007 .

TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure

Sungho Kang, Incheol Kim, Kicheol Kim, 2006, 2006 15th Asian Test Symposium.

The economic benefits of big science R&D: With a focus on fusion R&D program in Korea

Youbean Kim, Hyunsoo Tho, Wonjae Choi, 2017 .