Elie Maricau

Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

Georges G. E. Gielen, Montserrat Nafría, Guido Groeseneken, 2008, 2008 Design, Automation and Test in Europe.

Reliability Simulation of Analog ICs under Time-varying Stress in Nanoscale CMOS

Georges Gielen, Elie Maricau, G. Gielen, 2008 .

Advances in variation-aware modeling, verification, and testing of analog ICs

Georges G. E. Gielen, Trent McConaghy, Haralampos-G. D. Stratigopoulos, 2012, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis

Georges G. E. Gielen, Elie Maricau, G. Gielen, 2010, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines

Georges G. E. Gielen, Elie Maricau, G. Gielen, 2011, 2011 Proceedings of the ESSCIRC (ESSCIRC).

Design automation towards reliable analog integrated circuits

Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit, 2010, 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).