Y. Asao

发表

John K. DeBrosse, Toshiaki Kirihata, Matthew R. Wordeman, 1995, Digest of Technical Papers., Symposium on VLSI Circuits..

A. Nitayama, N. Shimomura, S. Ikegawa, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Fumio Horiguchi, Yoshiaki Asao, F. Horiguchi, 2016, IEICE Trans. Electron..

H. Hada, N. Shimomura, E. Kitagawa, 2005, INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005..

Akihiro Nitayama, Hiroaki Yoda, Tatsuya Kishi, 2008, 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.

Fumio Horiguchi, Yoshiaki Asao, F. Horiguchi, 2017, IEICE Trans. Electron..

Yoshihiro Ueda, Hiroaki Yoda, Yohji Watanabe, 2010, 2010 IEEE International Solid-State Circuits Conference - (ISSCC).

T. Ohsawa, K. Fujita, T. Higashi, 2002, 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).

S. Sawada, H. Ishiuchi, F. Matsuoka, 1992, 1992 International Technical Digest on Electron Devices Meeting.

Hiroaki Yoda, Shuichi Tahara, Tatsuya Kishi, 2004 .

Takahiko Hara, Y. Saito, Munehiro Yoshida, 1991 .