J. Bernard

The IC yield problem: A tentative analysis for MOS/SOS circuits

J. Bernard, 1978, IEEE Transactions on Electron Devices.

Physical Profile Measurements in Insulating Layers Using the Ion Analyser

M. Bruel, N. Hilleret, J. Bernard, 1973 .

A depletion load self-aligned technology

J. Borel, J. Bernard, J. P. Suat, 1973 .