R. Voorakaranam
发表
P. Blanche,
R. Norwood,
N. Peyghambarian,
2010,
Nature.
P. Blanche,
R. Norwood,
N. Peyghambarian,
2010
.
Peng Wang,
Robert A Norwood,
Nasser N Peyghambarian,
2008
.
P. Blanche,
R. Norwood,
N. Peyghambarian,
2008,
Nature.
C W Christenson,
R Voorakaranam,
R A Norwood,
2010,
Optics express.
R. Norwood,
N. Peyghambarian,
R. Himmelhuber,
2014,
IEEE Transactions on Microwave Theory and Techniques.
Gholam A. Peyman,
P. Blanche,
L. LaComb,
2021,
Applied optics.
R. Nelson,
Q. Zhan,
R. Norwood,
2014
.
A. Persoons,
R. Norwood,
N. Peyghambarian,
2008
.
Abhijit Chatterjee,
Soumendu Bhattacharya,
Sasikumar Cherubal,
2007,
IEEE Transactions on Circuits and Systems I: Regular Papers.
Abhijit Chatterjee,
John McLaughlin,
Sasikumar Cherubal,
2004,
17th International Conference on VLSI Design. Proceedings..
Abhijit Chatterjee,
Sasikumar Cherubal,
Ramakrishna Voorakaranam,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Abhijit Chatterjee,
Sasikumar Cherubal,
Ramakrishna Voorakaranam,
2002,
Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.
Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis
R. Voorakaranam,
S. Chakrabarti,
J. Hou,
1997,
Proceedings International Test Conference 1997.
R. Norwood,
N. Peyghambarian,
R. Voorakaranam,
2012
.
A. Persoons,
T. Verbiest,
R. Norwood,
2010
.
C W Christenson,
R Voorakaranam,
R A Norwood,
2011,
Optics letters.
Li Li,
Nasser Peyghambarian,
Jingdong Luo,
2014,
Journal of Lightwave Technology.
Nasser N Peyghambarian,
Pierre Alexandre Blanche,
Brittany Lynn,
2013
.
Nasser N Peyghambarian,
Brittany Lynn,
R. Voorakaranam,
2013
.
Peng Wang,
Weiping Lin,
C W Christenson,
2010,
Journal of Display Technology.
Robert A Norwood,
Nasser N Peyghambarian,
R. Voorakaranam,
2010,
OPTO.
R. Voorakaranam,
D. Flores,
P.-A. Blanche,
2008,
Journal of Display Technology.
Abhijit Chatterjee,
Alfred V. Gomes,
Ramakrishna Voorakaranam,
1998,
Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).