Ho Young Lee

Diagnosing manufacturing process variation using higher order statistics: a blind source separation approach

Ho Young Lee, 2000 .

Diagnosing spatial variation patterns in manufacturing processes

Ho Young Lee, Ho Young Lee, 2004 .

Samsung Equivalence Test for Output Parameters in Semiconductor Manufacturing

Hyung-Sun Kim, Sang Wook Choi, Ho Young Lee, 2006, 2006 IEEE International Symposium on Semiconductor Manufacturing.

Confidence stereo matching using complementary tree structures and global depth-color fitting

Jiwon Kim, Ho Young Lee, Young Ju Jeong, 2013, 2013 IEEE International Conference on Consumer Electronics (ICCE).

Pitch Contour Conversion Using Slanted Gaussian Normalization Based on Accentual Phrases

Ki Young Lee, Ho Young Lee, Myung Jin Bae, 2004 .

SEGMENTATION BY ACTIVE CONTOURS AND LEVEL SETS AND ITS APPLICATION IN MEDICAL IMAGES

Ho Young Lee, Sun Hee Kim, Myung Joo Kang, 2009 .

Diagnosing Manufacturing Variation Using Second-Order and Fourth-Order Statistics

Daniel W. Apley, Ho Young Lee, 2004 .