O. Wells

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Improved energy analyser for the scanning electron microscope

O. Wells, C. Bremer, 1969 .

Low‐Loss Image for Surface Scanning Electron Microscope

O. Wells, 1971 .

Low‐loss electron images of uncoated photoresist in the scanning electron microscope

O. Wells, 1986 .

Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1--Applications to accurate dimension measurements.

O. Wells, M. Postek, A. E. Vladár, 2001, Scanning.

Application of the low-loss scanning electron microscope image to integrated circuit technology part II--chemically-mechanically planarized samples.

O. Wells, M. Postek, A. E. Vladár, 2006, Scanning.

Low-energy scanning transmission electron microscope

O. Wells, D. A. Smith, 2013 .

Automatic positioning of device electrodes using the scanning electron microscope

R. K. Matta, T. E. Everhart, T. Everhart, 1965 .

2.3 Building a Scanning Electron Microscope

O. Wells, 2004 .

Magnetic domains in thin-film recording heads as observed in the SEM by a lock-in technique

O. Wells, R. Savoy, 1981 .

Recent developments in scanning electron microscopy

T. E. Everhart, C. W. Oatley, T. Everhart, 1960 .

Collector turret for scanning electron microscope.

O. Wells, C. Bremer, 1970, The Review of scientific instruments.

REVERSIBLE HILLOCK GROWTH IN THIN FILMS

S. K. Lahiri, O. Wells, 1969 .

Examination of uncoated photoresist by the low‐loss electron method in the scanning electron microscope

O. Wells, P. Cheng, 1987 .

XY table and tilting stage for scanning electron microscope (SEM)

O. Wells, 1975 .

Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)

A. N. Broers, Oliver C. Wells, A. Broers, 1973 .

NEW CONTRAST MECHANISM FOR SCANNING ELECTRON MICROSCOPE

Oliver C. Wells, O. Wells, 1970 .

Scanning Electron Microscopy

O. Wells, 1975 .

Coating, Mechanical Constraints, and Pressure Effects on Electromigration

Oliver C. Wells, F. d'Heurle, O. Wells, 1972 .

Voltage measurement in the scanning electron microscope

O. Wells, C. Bremer, O C Wells, 1968 .

Ion damage to the specimen in the SEM studied by the EBIC technique

O. Wells, 1978 .

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells, O. Wells, 2006 .

Evaluation of Passivated Integrated Circuits Using the Scanning Electron Microscope

R. K. Matta, T. E. Everhart, T. Everhart, 1964 .

Scanning reflection image from a solid specimen in the scanning electron microscope with a condenser-objective lens

O. Wells, 1988 .

Low-loss electron image in the sem

O. Wells, 1983 .

Reciprocity between the reflection electron microscope and the low loss scanning electron microscope Visual observations of macroscopic Inhomogeneous broadening of the R1 line In ruby

A. Boccara, D. Fournier, R. Capik, 1980 .

Effects of collector take-off angle and energy filtering on the BSE image in the SEM

O. Wells, 1979 .

Maskless laser patterning of insulating films from salt solutions

E. O'Sullivan, O. Wells, R. Gutfeld, 1994 .

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Oliver C. Wells, K.C.A. Smith, Dennis McMullan, 2008 .

Isolation of type‐2 magnetic contrast in the SEM by a lock‐in technique

O. Wells, 1979 .

Schlieren method as applied to magnetic recording heads in the scanning electron microscope

O. Wells, M. Brunner, 1983 .

Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope

O. Wells, 1985 .

Method for measuring the field from a magnetic recording head in the scanning electron microscope

O. Wells, 1983 .

Examining deep holes by rocking the beam in the scanning electron microscope

O. Wells, 1996 .

A novel method of semiconductor device measurements

T. Everhart, O. Wells, R. Matta, 1964 .

Explanation of the high resolution backscattered electron image in the scanning electron microscope by the twin-population theory historical review

O. Wells, 1993 .

How to write a book

Oliver C. Wells, O. Wells, 1981, IEEE Transactions on Professional Communication.

The early history and future of the SEM

David C. Joy, Oliver C. Wells, D. Joy, 2006 .

Imaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscope

Oliver C. Wells, M. Kawasaki, L. Gignac, 2005 .

High Energy Backscattered Electron Imaging of Subsurface Cu Interconnects

Masahiro Kawasaki, Oliver C. Wells, M. Kawasaki, 2005 .

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

O. Wells, Catherine A. Stoye, 1986 .

Applications of image diagnostics to metrology quality assurance and process control

Alexander Starikov, James E. Potzick, Mark P. Davidson, 2003, SPIE Advanced Lithography.

Past, present, and future of backscatter electron (BSE) imaging

Michael S. Gordon, Lynne M. Gignac, Oliver C. Wells, 2012, Defense + Commercial Sensing.

Imaging of Shallow Surface Topography by the Low-Loss Electron (LLE) Method in the Scanning Electron Microscope

O. Wells, 2002, Microscopy Today.

Magnetically filtered low‐loss scanning electron microscopy

R. Hodgson, O. Wells, F. Legoues, 1990 .

Proposed Scheme for a Directional Low-Loss Detector

O. Wells, 1976 .

Examination of Soft X-Ray Contact Images in Photoresist by the Low-Loss Electron Method in the Scanning Electron Microscope

P. Cheng, O. Wells, 1988 .

Penetration effect at sharp edges in the scanning electron microscope

O. Wells, 1978 .

Calculation of the heat-affected zone during pulsed electron-beam machining

O. Wells, 1965 .