P. Perdu

发表

Sample preparation of passivated VLSI circuits in view of the static voltage measurements through voltage contrast

P. Perdu, G. Perez, 1992 .

Backside laser testing of ICs for SET sensitivity evaluation

Hervé Lapuyade, D. Lewis, Philippe Perdu, 2001 .

Identification of some key parameters for photoelectric laser stimulation of IC: an experimental approach

P. Perdu, V. Pouget, D. Lewis, 2005, Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005..

Influence of Laser Pulse Duration in Single Event Upset Testing

P. Perdu, V. Pouget, D. Lewis, 2005, IEEE Transactions on Nuclear Science.

Optimizing Pulsed OBIC Technique for ESD Defect Localization

M. Bafleur, P. Perdu, V. Pouget, 2006, IEEE Transactions on Device and Materials Reliability.

Analysis of short-term NBTI effect on the Single-Event Upset sensitivity of a 65nm SRAM using two-photon absorption

P. Perdu, V. Pouget, D. Lewis, 2013, 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Backside SC-OBIC using a pulsed NIR-laser and its application to fault location

P. Perdu, D. Lewis, T. Beauchêne, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Fault localization by Dynamic Laser Stimulation extended testing

P. Perdu, P. Perdu, 2009, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

ESD defect localisation using photovoltaic laser stimulation techniques: optimization and interpretation

P. Perdu, D. Lewis, T. Beauchêne, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

A review of sample backside preparation techniques for VLSI

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2000 .

New non-destructive laser ablation based backside sample preparation method

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2000 .

Optimizing Pulsed OBIC Technique for ESD Defect Localization

Philippe Perdu, Dean Lewis, Nicolas Guitard, 2007 .

Laser-Based Target Preparation in 3D Integrated Electronic Packages

J. Wilde, P. Perdu, S. Martens, 2009 .

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Time Resolved Imaging at low power supply on 45nm technology

P. Perdu, D. Lewis, G. Bascoul, 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Light emission and TRE for a 120 nm technology case study: how much wavelength shift?

P. Perdu, R. Desplats, J. Roux, 2004, Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).

Dynamic Thermal Laser Stimulation Theory and Applications

P. Perdu, D. Lewis, K. Sanchez, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Laser Stimulation Applied to Dynamic IC Diagnostics

P. Perdu, D. Lewis, F. Beaudoin, 2003 .

Facing more than moore, is magnetic microscopy the new Swiss knife for 3D defect localization in SiP?

P. Perdu, F. Infante, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS

A. Oates, P. Perdu, J. Walraven, 2016 .

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure

N. Nolhier, P. Perdu, V. Pouget, 2005, Microelectron. Reliab..

Optimizing pulsed OBICtechnique forESDdefect localization

M. Bafleur, P. Perdu, V. Pouget, 2006 .

Internal Testing of Programmable Circuits

P. Perdu, R. Desplats, 2000 .

Electrical degradation of CMOS devices due to focused ion beam exposure

P. Perdu, A. Touboul, N. Labat, 1998, 1998 3rd International Symposium on Plasma Process-Induced Damage (Cat. No.98EX100).

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques

Philippe Perdu, Kevin Sanchez, Olivier Crepel, 2007 .

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Direct Measurements of Charge in Floating Gate Transistor Channels of Flash Memories Using Scanning Capacitance Microscopy

P. Perdu, R. Desplats, C. Nardi, 2006 .

Automatic localization of signal sources in photon emission images for integrated circuit analysis

S. Jacquir, P. Perdu, K. Sanchez, 2017, Signal, Image and Video Processing.

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC

G. Pataut, Nathalie Labat, Nathalie Malbert, 2007, Microelectron. Reliab..

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization

Vincent Bley, Thierry Lebey, Philippe Perdu, 2015, Microelectron. Reliab..

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques

Nathalie Labat, Nathalie Malbert, Benoit Lambert, 2008, Microelectron. Reliab..

Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies

D. Lewis, Luca Silvestri, Maxime Penzes, 2017, Microelectron. Reliab..

Dynamic study of the thermal laser stimulation response on advanced technology structures

Philippe Perdu, M. de la Bardonnie, Patrick Poirier, 2008, Microelectron. Reliab..

Current leakage fault localization using backside OBIRCH

P. Perdu, F. Beaudoin, G. Imbert, 2001, Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, IEEE Transactions on Nuclear Science.

When Failure Analysis Meets Side-Channel Attacks

Bruno Rouzeyre, Lionel Torres, Philippe Perdu, 2010, CHES.

Pattern image enhancement by automatic focus correction

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, Microelectron. Reliab..

Life issues, robustness consequences and reliability challenges for Very Deep Sub Micron technologies

Philippe Perdu, P. Perdu, 2010, 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.