N. Parihar

发表

Narendra Parihar, Souvik Mahapatra, Nilesh Goel, 2018, IEEE Transactions on Electron Devices.

Narendra Parihar, Souvik Mahapatra, James H. Stathis, 2018, IEEE Transactions on Electron Devices.

S. Mahapatra, N. Parihar, Tarun Samadder, 2021, IEEE Transactions on Electron Devices.

S. Mahapatra, N. Parihar, N. Goel, 2020, 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).

S. Mahapatra, N. Parihar, N. Goel, 2020, IEEE Journal of the Electron Devices Society.

S. Mahapatra, N. Parihar, Satyam Kumar, 2020, IEEE Transactions on Electron Devices.

S. Mahapatra, N. Parihar, 2020, IEEE Transactions on Device and Materials Reliability.

S. Mahapatra, N. Parihar, S. Mukhopadhyay, 2020, 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

V. Moroz, S. Mahapatra, H. Wong, 2019, IEEE Transactions on Electron Devices.

V. Moroz, S. Mahapatra, H. Wong, 2019, IEEE Transactions on Electron Devices.

S. Mahapatra, H. Wong, N. Parihar, 2019, 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

S. Mahapatra, N. Parihar, A. Chaudhary, 2019, IEEE Transactions on Electron Devices.

Chetan Kumar Dabhi, Y. Chauhan, S. Mahapatra, 2018, IEEE Transactions on Electron Devices.

S. Mahapatra, N. Parihar, N. Goel, 2017, IEEE Transactions on Electron Devices.

N. Parihar, N. Goel, S. Mahapatra, 2021, Recent Advances in PMOS Negative Bias Temperature Instability.

N. Parihar, S. Mahapatra, Tarun Samadder, 2021, Recent Advances in PMOS Negative Bias Temperature Instability.

N. Parihar, S. Mukhopadhyay, Nilesh Goel, 2021, Recent Advances in PMOS Negative Bias Temperature Instability.

Christopher J. Tassone, D. Kwon, Aranyak Mehta, 2022, Nature.

Jörg Henkel, Victor M. van Santen, Hussam Amrouch, 2016, 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Narendra Parihar, Nilotpal Choudhury, Souvik Mahapatra, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Narendra Parihar, Souvik Mahapatra, S. Mahapatra, 2018, Microelectron. Reliab..

Narendra Parihar, Souvik Mahapatra, Ankush Chaudhary, 2016, IEEE Transactions on Electron Devices.

Jörg Henkel, Hussam Amrouch, Narendra Parihar, 2019, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Jörg Henkel, Hussam Amrouch, Narendra Parihar, 2019, IEEE Transactions on Electron Devices.

Narendra Parihar, Souvik Mahapatra, Subrat Mishra, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Narendra Parihar, Souvik Mahapatra, Miaomiao Wang, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).