N. Goel
发表
Narendra Parihar,
Souvik Mahapatra,
Nilesh Goel,
2018,
IEEE Transactions on Electron Devices.
M. Alam,
S. Mahapatra,
A. Islam,
2013,
IEEE Transactions on Electron Devices.
S. Mahapatra,
T. Naphade,
N. Goel,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
S. Mahapatra,
K. Joshi,
N. Goel,
2016
.
S. Mahapatra,
N. Goel,
2016
.
S. Mahapatra,
N. Goel,
S. Mukhopadhyay,
2016
.
S. Mahapatra,
N. Parihar,
N. Goel,
2020,
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
S. Mahapatra,
N. Parihar,
N. Goel,
2020,
IEEE Journal of the Electron Devices Society.
Souvik Mahapatra,
Nilesh Goel,
Subhadeep Mukhopadhyay,
2016,
IEEE Transactions on Electron Devices.
S. Mahapatra,
N. Parihar,
N. Goel,
2017,
IEEE Transactions on Electron Devices.
S. Mahapatra,
K. Joshi,
N. Goel,
2016
.
N. Parihar,
N. Goel,
S. Mahapatra,
2021,
Recent Advances in PMOS Negative Bias Temperature Instability.
Siona Menezes Picardo,
Jani Babu Shaik,
N. Goel,
2021
.
S. Mahapatra,
M. Alam,
A. Islam,
2016
.
S. Mahapatra,
N. Goel,
K. Joshi,
2014,
2014 IEEE International Reliability Physics Symposium.
S. Mahapatra,
N. Goel,
K. Joshi,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
Narendra Parihar,
Souvik Mahapatra,
Ankush Chaudhary,
2016,
IEEE Transactions on Electron Devices.
Souvik Mahapatra,
Nilesh Goel,
Tejas Naphade,
2015,
2015 IEEE International Reliability Physics Symposium.
Jörg Henkel,
Hussam Amrouch,
Narendra Parihar,
2019,
IEEE Transactions on Electron Devices.