B. Kämpfe

Investigation of residual stresses in microsystems using X-ray diffraction

B. Kämpfe, Bernd Kämpfe, 2000 .

Raman spectroscopic and X‐ray investigation of stressed states in diamond‐like carbon films

B. Kämpfe, E. Auerswald, R. Krawietz, 2005 .

X-Ray Stress Analysis by Use of an Area Detector

B. Kämpfe, S. Goldenbogen, A. Schubert, 1997 .

Application of Energy Dispersive X-Ray Diffraction for the Efficient Investigation of Internal Stresses in Thin Films

B. Kämpfe, U. Zschenderlein, B. Schultrich, 2007 .

Energy Dispersive X‐Ray Diffraction

B. Kämpfe, Bernd Dr.-Ing.habil. Kämpfe, Falk Luczak, 2005 .