C. Mouli

Current status and future prospects of non-volatile memory modeling

A. Benvenuti, A. Ghetti, A. Mauri, 2014, 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Using TCAD, Response Surface Model and Monte Carlo Methods to Model Processes and Reduce Device Variation

Dipanjan Basu, C. Mouli, P. Vaidyanathan, 2009, 2009 International Conference on Simulation of Semiconductor Processes and Devices.

CMOS imager technology shrinks and image performance

C. Mouli, J. McKee, S. Smith, 2004, 2004 IEEE Workshop on Microelectronics and Electron Devices.

Trends in memory technology - reliability perspectives, challenges and opportunities

K. Prall, C. Mouli, C. Roberts, 2007, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Voltage-Triggered Ultrafast Phase Transition in Vanadium Dioxide Switches

Xiaonan Chen, C. Mouli, You Zhou, 2013, IEEE Electron Device Letters.