E. Rying

A Novel Focused Local Learning Wavelet Network with Application to In Situ Monitoring During Selective Silicon Epitaxy

E. Rying, Eric Arne Rying, 2001 .

Focused Local Learning With

G. Bilbro, Jye-Chyi Lu, E. Rying, 2002 .

In situ selectivity and thickness monitoring during selective silicon epitaxy using quadrupole mass spectrometry and wavelets

Jye-Chyi Lu, G. Bilbro, E. Rying, 2005, IEEE Transactions on Semiconductor Manufacturing.