H. Kufluoglu

发表

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of

K. Roy, B. Paul, M. Alam, 2007 .

A Generalized Reaction–Diffusion Model With Explicit H– $\hbox{H}_{2}$ Dynamics for Negative-Bias Temperature-Instability (NBTI) Degradation

H. Kufluoglu, M.A. Alam, H. Kufluoglu, 2007, IEEE Transactions on Electron Devices.

MOSFET degradation due to negative bias temperature instability (NBTI) and hot carrier injection (HCI), and its implications for reliability-aware VLSI design

H. Kufluoglu, H. Kufluoglu, Ashraf Alam, 2007 .

A geometrical unification of the theories of NBTI and HCI time-exponents and its implications for ultra-scaled planar and surround-gate MOSFETs

H. Kufluoglu, M. Ashraful Alam, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Critical analysis of short-term negative bias temperature instability measurements : Explaining the effect of time-zero delay for on-the-fly measurements

M. Alam, A. Islam, D. Varghese, 2007 .

On Quasi-Saturation of Negative Bias Temperature Degradation

M. Alam, H. Kufluoglu, 2005 .

Theory of interface-trap-induced NBTI degradation for reduced cross section MOSFETs

M.A. Alam, H. Kufluoglu, M. A. Alam, 2006, IEEE Transactions on Electron Devices.

A Computational Model of NBTI and Hot Carrier Injection Time-Exponents for MOSFET Reliability

H. Kufluoglu, Muhammad A. Alam, M. Alam, 2004 .

off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown

H. Shichijo, H. Kufluoglu, D. Varghese, 2007, IEEE Transactions on Electron Devices.

Universality of Off-State Degradation in Drain Extended NMOS Transistors

M.A. Alam, V. Reddy, S. Krishnan, 2006, 2006 International Electron Devices Meeting.

History Dependent Recovery of NBTI under Alternating DC and AC Stress

C. Prasad, M. Agostinelli, H. Kufluoglu, 2007, 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

Multi-probe Two-Dimensional Mapping of Off-State Degradation in DeNMOS Transistors: How and Why Interface Damage Predicts Gate Dielectric Breakdown

M.A. Alam, V. Reddy, S. Krishnan, 2007, 2007 IEEE International Electron Devices Meeting.

Impact of NBTI on the temporal performance degradation of digital circuits

B.C. Paul, Kunhyuk Kang, H. Kufluoglu, 2005, IEEE Electron Device Letters.

Recent Issues in Negative-Bias Temperature Instability: Initial Degradation, Field Dependence of Interface Trap Generation, Hole Trapping Effects, and Relaxation

S. Mahapatra, H. Kufluoglu, D. Varghese, 2007, IEEE Transactions on Electron Devices.

A comprehensive model for PMOS NBTI degradation: Recent progress

D. Varghese, Haldun Kufluoglu, Muhammad Ashraful Alam, 2007, Microelectron. Reliab..

Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

Kaushik Roy, Bipul Chandra Paul, Kunhyuk Kang, 2007, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Temporal Performance Degradation under NBTI: Estimation and Design for Improved Reliability of Nanoscale Circuits

Kaushik Roy, Bipul Chandra Paul, Kunhyuk Kang, 2006, Proceedings of the Design Automation & Test in Europe Conference.