J. King

An AC conductance technique for measuring self-heating in SOI MOSFET's

Chenming Hu, C. Wann, P. Ko, 1995, IEEE Electron Device Letters.

Accelerated testing of SiO/sub 2/ reliability

Elyse Rosenbaum, Chenming Hu, C. Hu, 1996 .

Simulating process-induced gate oxide damage in circuits

Chenming Hu, Hyungcheol Shin, C. Hu, 1997 .

Efficient gate oxide defect screen for VLSI reliability

Chenming Hu, W. Y. Chan, C. Hu, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.

SOI/bulk hybrid technology on SIMOX wafers for high performance circuits with good ESD immunity

Chenming Hu, Mansun Chan, P. Ko, 1995, IEEE Electron Device Letters.

ccelerated Testing of Si02 Reliability

C. Hu, E. Rosenbaum, J. King, 1996 .

Effect of low and high temperature anneal on process-induced damage of gate oxide

Chenming Hu, J. King, J.C. King, 1994, IEEE Electron Device Letters.

A versatile, SOI BiCMOS technology with complementary lateral BJT's

Chenming Hu, S. Parke, F. Assaderaghi, 1992, 1992 International Technical Digest on Electron Devices Meeting.

SOI MOSFET modeling using an AC conductance technique to determine heating

P. Ko, C. Wann, R. Tu, 1994, Proceedings. IEEE International SOI Conference.