M. Hendriks

Accurate determination of channel length, series resistance and junction doping profile for MOSFET optimisation in deep submicron technologies

S. Kubicek, K. De Meyer, S. Biesemans, 1996, 1996 Symposium on VLSI Technology. Digest of Technical Papers.

Low-Voltage Embedded Flash-EEPROM in 0.18 μm CMOS

Guoqiao Tao, Antonio Cacciato, R. Verhaar, 2001 .