H. Mingam

Surface mobility in n/sup +/ and p/sup +/ doped polysilicon gate PMOS transistors

H. Mingam, P. Delpech, D. Amm, 1989 .

Fully-depleted SOI CMOS technology using WXN metal gate and HfSixOyNZ high-k dielectric

O. Faynot, M. Orlowski, T. Skotnicki, 2007, ESSDERC 2007 - 37th European Solid State Device Research Conference.

Optimization of a self-aligned titanium silicide process for submicron technology

M. Paoli, M. Haond, P. Delpech, 1990 .

Innovative Materials, Devices, and CMOS Technologies for Low-Power Mobile Multimedia

T. Skotnicki, S. Monfray, F. Arnaud, 2008, IEEE Transactions on Electron Devices.

Hot-carrier stressing damage in wide and narrow LDD NMOS transistors

M. Bourcerie, H. Mingam, A. Boudou, 1989, IEEE Electron Device Letters.

Electrical properties of halogen lamp recrystallized silicon films on SiO2

G. Vincent, A. Chantre, H. Mingam, 1984 .