A. Teramoto

发表

S. Sugawa, A. Teramoto, R. Kuroda, 2020, Japanese Journal of Applied Physics.

S. Sugawa, A. Teramoto, K. Hashimoto, 2019, Japanese Journal of Applied Physics.

T. Ohmi, P. Gaubert, S. Sugawa, 2007, IEEE Transactions on Electron Devices.

A. Teramoto, H. Kikuyama, M. Miyashita, 2005, Scientific Wet Process Technology for Innovative LSI/FPD Manufacturing.

A. Teramoto, H. Morinaga, S. Ojima, 2005 .

T. Ohmi, K. Nakamura, A. Teramoto, 1993 .

T. Ohmi, K. Kotani, A. Teramoto, 1991, IEEE Electron Device Letters.

T. Ohmi, S. Sugawa, A. Teramoto, 2009, IEEE Transactions on Semiconductor Manufacturing.

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2011, 2011 International Reliability Physics Symposium.

R. Kuroda, S. Sugawa, T. Ohmi, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

R. Kuroda, S. Sugawa, Y. Kumagai, 2011, IEEE Transactions on Electron Devices.

T. Ohmi, S. Kuroki, S. Sugawa, 2011, 2011 IEEE International Interconnect Technology Conference.

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2010, 2010 IEEE International Reliability Physics Symposium.

S. Sugawa, A. Teramoto, R. Kuroda, 2020, IEEE Transactions on Semiconductor Manufacturing.

S. Sugawa, Y. Kumagai, T. Ohmi, 2008, 2008 IEEE International Reliability Physics Symposium.

Tadahiro Ohmi, Shigetoshi Sugawa, Yuki Kumagai, 2009, 2009 IEEE International Reliability Physics Symposium.

Tadahiro Ohmi, Naoto Miyamoto, Shigetoshi Sugawa, 2009 .

Tadahiro Ohmi, Akinobu Teramoto, T. Ohmi, 2011 .

S. Sugawa, A. Teramoto, R. Kuroda, 2018, IEEE Electron Device Letters.

A. Teramoto, Hiroshi Watanabe, Che-An Lee, 2017, 2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO).

A. Teramoto, T. Suwa, Fuminobu Imaizumi, 2018, 2018 IEEE SENSORS.

A. Yasuoka, M. Sekine, A. Teramoto, 1996, 1996 International Integrated Reliability Workshop Final Report.

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

Koji Kotani, Tadahiro Ohmi, Shigetoshi Sugawa, 2004 .

T. Ohmi, S. Sugawa, K. Kotani, 2003, IEEE International Electron Devices Meeting 2003.

S. Sugawa, T. Ohmi, T. Ohmi, 2010, 2010 Symposium on VLSI Technology.

A. Teramoto, Hiroshi Watanabe, Che-An Lee, 2018, IEEE Transactions on Electron Devices.

T. Ohmi, S. Sugawa, A. Teramoto, 2009, IEEE Transactions on Components and Packaging Technologies.

S. Sugawa, A. Teramoto, R. Kuroda, 2017, IEEE Electron Device Letters.

P. Gaubert, S. Sugawa, A. Teramoto, 2017, 2017 International Conference on Noise and Fluctuations (ICNF).

P. Gaubert, S. Sugawa, A. Teramoto, 2015, 2015 International Conference on Noise and Fluctuations (ICNF).

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2012 .

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2011 .

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007 .

T. Ohmi, S. Sugawa, A. Teramoto, 2012, IEEE Transactions on Semiconductor Manufacturing.

A. Teramoto, M. Hirayama, Kiyoteru Kobayashi, 1995 .

K. Tsunekawa, S. Sugawa, A. Teramoto, 2019, Japanese Journal of Applied Physics.

T. Ohmi, T. Ohmi, A. Teramoto, 2008, IEEE Transactions on Magnetics.

T. Ohmi, A. Teramoto, M. Ishitsuka, 2009, Journal of physics. Condensed matter : an Institute of Physics journal.

S. Sugawa, A. Teramoto, R. Kuroda, 2019, ECS Journal of Solid State Science and Technology.

R. Kuroda, S. Sugawa, Y. Kumagai, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

T. Ohmi, A. Teramoto, M. Ishitsuka, 2009, IEEE Transactions on Magnetics.

T. Ohmi, Y. Shirai, A. Teramoto, 2008, IEEE Transactions on Semiconductor Manufacturing.

T. Ohmi, Y. Shirai, A. Teramoto, 2007, 2007 International Symposium on Semiconductor Manufacturing.

R. Kuroda, N. Miyamoto, T. Ohmi, 2007, IEEE Transactions on Electron Devices.

T. Ohmi, Y. Morozumi, S. Sugawa, 2013 .

R. Kuroda, S. Watabe, S. Sugawa, 2012, IEEE Transactions on Semiconductor Manufacturing.

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

S. Sugawa, A. Teramoto, R. Kuroda, 2022, Journal of Vacuum Science & Technology A.

H. Umeda, Y. Ohno, K. Kobayashi, 2001, Microelectron. Reliab..

Tadahiro Ohmi, Takeyoshi Kato, Yasuyuki Shirai, 2005 .

K. Shiga, Akinobu Teramoto, K. Azamawari, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007, Microelectron. Reliab..

S. Sugawa, A. Teramoto, R. Kuroda, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2009, IEICE Trans. Electron..

K. Kotani, T. Ohmi, P. Gaubert, 2006, IEEE Transactions on Electron Devices.

Kazufumi Watanabe, Shigetoshi Sugawa, Tadahiro Ohmi, 2003 .

P. Gaubert, A. Teramoto, 2017 .

Tadahiro Ohmi, Akinobu Teramoto, Shigetoshi Sugawa, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2008, Microelectron. Reliab..

Rihito Kuroda, Akinobu Teramoto, Shigetoshi Sugawa, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

R. Akimoto, R. Kuroda, A. Teramoto, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Rihito Kuroda, Akihiro Yonezawa, Akinobu Teramoto, 2013, IEEE Transactions on Electron Devices.

Tadahiro Ohmi, Rihito Kuroda, Akihiro Yonezawa, 2014, 2014 IEEE International Reliability Physics Symposium.

R. Kuroda, S. Sugawa, T. Ohmi, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

T. Ohmi, P. Gaubert, S. Sugawa, 2013, 2013 22nd International Conference on Noise and Fluctuations (ICNF).

Rihito Kuroda, Yasuhisa Tochigi, Shigetoshi Sugawa, 2014, 2014 IEEE International Reliability Physics Symposium.

H. Watanabe, A. Teramoto, K. Kobayashi, 1996, International Electron Devices Meeting. Technical Digest.

A. Teramoto, K. Kobayashi, M. Hirayama, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

Akinobu Teramoto, M. Katsumata, M. Sekine, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).

A. Teramoto, K. Kobayashi, M. K. Mazumder, 1997, Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.