S. Sinha

Opposite-channel-based injection of hot-carriers in SOI MOSFET's: physics and applications

Dimitris E. Ioannou, S. P. Sinha, A. Zaleski, 1998 .

Time dependence power laws of hot carrier degradation in SOI MOSFETS

H. Hughes, D. Ioannou, F. Duan, 1996, 1996 IEEE International SOI Conference Proceedings.

Hot electron lifetimes of partially-depleted 0.35 /spl mu/m SOI NMOS transistors

S. T. Liu, S. Sinha, W. Jenkins, 2000, 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125).

A 5 nm nitrided gate oxide for 0.25 /spl mu/m SOI CMOS technologies

S. T. Liu, H. Hughes, S. Sinha, 1999 .

LDD design tradeoffs for single transistor latch-up and hot carrier degradation control in accumulation mode FD SOI MOSFET's

D. Ioannou, F. Duan, S. Sinha, 1997 .

Investigation of carrier generation in fully depleted enhancement and accumulation mode SOI MOSFET's

Dimitris E. Ioannou, S. P. Sinha, A. Zaleski, 1994 .

Advantages and challenges of high performance CMOS on SOI

D. Wristers, Darin Chan, Mario M. Pelella, 2001, 2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207).

Worst case total dose radiation response of 0.35 /spl mu/m SOI CMOSFETs

S. T. Liu, S. Balster, S. P. Sinha, 1999 .