T. Moise

发表

Theodore S. Moise, Gary A. Frazier, Alan Seabaugh, 1997 .

Gerhard Klimeck, Theodore S. Moise, Roger K. Lake, 1997, Journal of Applied Physics.

Gerhard Klimeck, Theodore S. Moise, Roger K. Lake, 1995 .

R. Khamankar, L. Colombo, S. J. Fang, 1997, International Electron Devices Meeting. IEDM Technical Digest.

H. McAdams, J. McPherson, K. Udayakumar, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

T. Moise, T. Moise, V. Ley, 1996, International Electron Devices Meeting. Technical Digest.

A. Seabaugh, T. Moise, Yung-Chung Kao, 1994, IEEE Electron Device Letters.

Gerhard Klimeck, D. Jovanovic, Y. Kao, 1996, 1996 54th Annual Device Research Conference Digest.

C. Schow, C. Goldsmith, Y. Kao, 1997, 1997 55th Annual Device Research Conference Digest.

J. L. Huber, M. Reed, A. Seabaugh, 1995, Proceedings IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits.

A. Seabaugh, E. Beam, Y. Kao, 1993, 51st Annual Device Research Conference.

H. McAdams, K. Udayakumar, J. Rodriguez, 2004, Proceedings. 2004 IEEE Computational Systems Bioinformatics Conference.

K. Udayakumar, T. Moise, L. Hall, 2003 .

T. Moise, P. Sharma, J. Seidel, 2021, Advanced Functional Materials.

K. Remack, K. Boku, T. Moise, 2004, IEEE Transactions on Device and Materials Reliability.

C.L. Goldsmith, J.C. Campbell, C. Schow, 1997, IEEE Photonics Technology Letters.

L. D. Garrett, Theodore S. Moise, Yung-Chung Kao, 1995 .

S. Natarajan, J. Rodriguez, T. Moise, 2004, IEEE Journal of Solid-State Circuits.

J. Rodriguez, K. Remack, K. Boku, 2002, Digest. International Electron Devices Meeting,.

T. Moise, G. Klimeck, T. Boykin, 1997, 1997 55th Annual Device Research Conference Digest.

Gerhard Klimeck, Theodore S. Moise, Roger K. Lake, 1997 .

Gerhard Klimeck, Theodore S. Moise, Roger K. Lake, 1997 .

Paul Sotirelis, Dejan Jovanovic, Vijit Sabnis, 1996, Photonics West.

B. Brar, T.S. Moise, T.P.E. Broekaert, 1997, GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997.

Theodore S. Moise, Stephen R. Gilbert, Joe W. McPherson, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).