K. Ralls

发表

Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency ( 1 f ?) Noise

R. Howard, L. Jackel, D. Tennant, 1984 .

Related Fabrication and Phenomena

M. Roukes, H. Grubin, M. Kozicki, 1989 .

Fabrication of thin‐film metal nanobridges

R. Buhrman, K. Ralls, R. Tiberio, 1989 .

Engineering of ultrathin barriers in high TC, trilayer Josephson junctions

G. Virshup, J. Eckstein, K. Ralls, 1992 .

Atomically layered growth and properties of high temperature superconducting single-crystal films and superlattices

G. Virshup, J. Eckstein, K. Ralls, 1992 .

Critical parameters of superconducting materials and structures

K. Ralls, P. Sterne, A. Chaiken, 1995 .

Defect interactions and noise in metallic nanoconstrictions.

R. Buhrman, Buhrman, K. Ralls, 1988, Physical review letters.

Microscopic study of 1/f noise in metal nanobridges.

R. Buhrman, Buhrman, K. Ralls, 1991, Physical review. B, Condensed matter.