C. Yim
发表
Kangho Lee,
Georg S. Duesberg,
Niall McEvoy,
2013,
Nano letters.
M. Prato,
J. Coleman,
C. Coletti,
2020,
2D Materials.
Conor P. Cullen,
Jannik C. Meyer,
G. Duesberg,
2016,
ACS nano.
G. Duesberg,
C. Fritzen,
N. McEvoy,
2018,
Nano letters.
P. Hurley,
S. Monaghan,
G. Duesberg,
2018,
Nano letters.
G. Duesberg,
N. McEvoy,
C. Yim,
2018,
npj 2D Materials and Applications.
G. Duesberg,
A. Dreuw,
C. Yim,
2020
.
G. Duesberg,
N. McEvoy,
C. Yim,
2019,
ACS Photonics.
Max C. Lemme,
Satender Kataria,
Vikram Passi,
2015,
1509.01021.
G. Duesberg,
N. McEvoy,
C. Yim,
2013
.
G. Duesberg,
Hye-Young Kim,
N. McEvoy,
2013,
ACS applied materials & interfaces.
C. Yim,
Kyungkon Kim,
J. Huh,
2006
.
Conor P. Cullen,
Jannik C. Meyer,
G. Duesberg,
2016,
ACS nano.
G. Duesberg,
A. Hirsch,
C. Backes,
2015,
Nanoscale.
G. Duesberg,
N. McEvoy,
C. Yim,
2017,
1707.06824.
G. Duesberg,
C. Yim,
M. Lemme,
2015,
1509.01021.
G. Duesberg,
N. McEvoy,
C. Yim,
2012
.
G. Duesberg,
N. McEvoy,
C. Yim,
2012,
Small.
G. Duesberg,
N. McEvoy,
C. Yim,
2015,
ACS nano.
G. Duesberg,
C. Yim,
M. Lemme,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
G. Duesberg,
N. McEvoy,
C. Yim,
2015
.
Jannik C. Meyer,
J. Donegan,
G. Duesberg,
2015,
1512.09317.
G. Duesberg,
A. Hirsch,
N. McEvoy,
2018,
Nanoscale.
K. Chung,
C. Yim,
M. Cho,
2006
.
G. Duesberg,
Hye-Young Kim,
Kangho Lee,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
G. Fiori,
G. Iannaccone,
G. Duesberg,
2014,
Scientific Reports.
G. Duesberg,
N. McEvoy,
C. Yim,
2014,
Nanoscale.
C. Yim,
Heon-Ju Lee,
O. Penkov,
2008,
The Review of scientific instruments.
G. Duesberg,
C. Yim,
T. Hallam,
2014
.
G. Duesberg,
N. McEvoy,
C. Yim,
2014
.
Kangho Lee,
Hye-Young Kim,
Georg S. Duesberg,
2013,
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
Change in the interfacial reaction of Hf-silicate film as a function of thickness and stoichiometry.
H. Sohn,
K. Chung,
C. Yim,
2008,
The Journal of chemical physics.
Enhanced Electrical Properties of SrTiO3 Thin Films Grown by Plasma-Enhanced Atomic Layer Deposition
C. Yim,
Y. Kang,
M. Cho,
2011
.